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Structural and magnetic properites of Xe ion irradiated Co/Si bilayers

dc.creatorNenadović, Miloš
dc.creatorPopović, Maja
dc.creatorNovaković, Mirjana M.
dc.creatorBibić, Nataša M.
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2018-07-05T07:20:01Z
dc.date.available2018-07-05T07:20:01Z
dc.date.issued2008
dc.identifier.issn0373-3742
dc.identifier.urihttps://ui.adsabs.harvard.edu//#abs/2008POBeo..84..193N/abstract
dc.identifier.urihttps://vinar.vin.bg.ac.rs/handle/123456789/7709
dc.description.abstractPolycrystalline cobalt layers, deposited on Si(110) wafers via electron beam evaporation to a thickness of 55 nm, were irradiated at room temperature with 200 keV Xe ions to fluences of up to 15 x10^15 ions/cm^2.The atomic and magnetic force microscopy (AFM and MFM) were used to investigate the changes in the roughness and magnetic properties of the Co/Si bilayers. Ion beam induced structural changes were correlated with magnetic properties.en
dc.language.isoensr
dc.rightsopenAccesssr
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourcePublications of the Astronomical Observatory of Belgradesr
dc.titleStructural and magnetic properites of Xe ion irradiated Co/Si bilayersen
dc.typearticlesr
dc.rights.licenseBY-NC-NDsr
dcterms.abstractНенадовић, Милош; Новаковић, Мирјана М.; Ракочевић, Златко Љ.; Поповић, Маја; Бибић, Наташа М.;
dc.citation.volume84
dc.citation.spage193
dc.citation.epage196
dc.type.versionpublishedVersionsr
dc.identifier.fulltexthttps://vinar.vin.bg.ac.rs//bitstream/id/10136/193-196.pdf
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_vinar_7709


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