Structural and magnetic properites of Xe ion irradiated Co/Si bilayers

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2008
Authors
Nenadović, Miloš
Popović, Maja
Novaković, Mirjana M.
Bibić, Nataša M.
Rakočević, Zlatko Lj.
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Abstract
Polycrystalline cobalt layers, deposited on Si(110) wafers via electron beam evaporation to a thickness of 55 nm, were irradiated at room temperature with 200 keV Xe ions to fluences of up to 15 x10^15 ions/cm^2.The atomic and magnetic force microscopy (AFM and MFM) were used to investigate the changes in the roughness and magnetic properties of the Co/Si bilayers. Ion beam induced structural changes were correlated with magnetic properties.
Source:
Publications of the Astronomical Observatory of Belgrade, 2008, 84, 193-196

ISSN: 0373-3742 (print)

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https://ui.adsabs.harvard.edu//#abs/2008POBeo..84..193N/abstract
http://vinar.vin.bg.ac.rs/handle/123456789/7709
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