Characterization, analysis and modeling of physical phenomena in thin layers for application in MOS nanodevices
Link to this page
http://vinar.vin.bg.ac.rs/APP/faces/project.xhtml?project_id=info%3Aeu-repo%2FgrantAgreement%2FMESTD%2FBasic+Research+%28BR+or+ON%29%2F171026%2FRS%2F%2F&item_offset=0&author_offset=0&sort_by=dc.date.issued
info:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/171026/RS//
Characterization, analysis and modeling of physical phenomena in thin layers for application in MOS nanodevices (en)
Карактеризација, анализа и моделовање физичких појава у танким слојевима за примену у MOS нанокомпонентама (sr)
Karakterizacija, analiza i modelovanje fizičkih pojava u tankim slojevima za primenu u MOS nanokomponentama (sr_RS)