| dc.creator | Jokanović, Vukoman R. | |
| dc.creator | Čolović, Božana M. | |
| dc.creator | Bundaleski, Nenad | |
| dc.creator | Jokanović, M. | |
| dc.creator | Trajkovska Petkoska, Anka | |
| dc.creator | Ferrara, Manuela | |
| dc.creator | Nasov, Ilija | |
| dc.creator | Rakočević, Zlatko Lj. | |
| dc.date.accessioned | 2018-07-05T12:28:22Z | |
| dc.date.available | 2018-07-05T12:28:22Z | |
| dc.date.issued | 2018 | |
| dc.identifier.issn | 1454-4164 | |
| dc.identifier.uri | https://joam.inoe.ro/index.php?option=magazine&op=view&idu=4206&catid=110 | |
| dc.identifier.uri | https://vinar.vin.bg.ac.rs/handle/123456789/7716 | |
| dc.description.abstract | Optical properties of TixOy thin film, of thickness 125 nm, obtained by pulsed magnetron sputtering were investigated in this paper. XRD analysis revealed the presence of anatase, rutile, TiO, Ti2O3and Ti3O5phases. XPS analysis showed similar results. SEM analysis showed quite smooth surface of the film. Spectroscopic ellipsometry revealed sharp decrease of refractive index in wavelength range 300-500 nm and extremely low values of extinction coefficients which are less than 0.01 at wavelengths equal to or higher than 500 nm. | en |
| dc.relation | info:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/172026/RS// | |
| dc.relation | info:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS// | |
| dc.rights | restrictedAccess | |
| dc.source | Journal of Optoelectronics and Advanced Materials | |
| dc.subject | pulsed magnetron sputtering | en |
| dc.subject | TixOy thin film | en |
| dc.subject | refractive index | en |
| dc.subject | extinction coefficient | en |
| dc.title | TixOy thin films with extremely low extinction coefficients obtained by pulsed magnetron sputtering | en |
| dc.type | article | en |
| dc.rights.license | ARR | |
| dcterms.abstract | Бундалески, Н.; Ракочевић, З.; Јокановић, В.; Чоловић, Б.; Јокановић, М.; Петкоска, A.Т.; Феррара, М.; Насов, И.; | |
| dc.rights.holder | © 2018, National Institute of Optoelectronics | |
| dc.citation.volume | 20 | |
| dc.citation.issue | 3-4 | |
| dc.citation.spage | 169 | |
| dc.citation.epage | 174 | |
| dc.citation.rank | M23 | |
| dc.type.version | publishedVersion | |
| dc.identifier.scopus | 2-s2.0-85048109141 | |
| dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_vinar_7716 | |
