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PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction

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2025
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Authors
Petković, Darija
Ho, Hsin-Chia
Kovač, Janez
Trstenjak, Urška
Vengust, Damjan
Jovanović, Sonja
Spreitzer, Matjaž
Jovanović, Zoran M.
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Abstract
Strontium titanate (STO) thin films epitaxially grown on silicon (Si) substrates act as both protective and electroactive layers in photoelectrochemical (PEC) water splitting. To investi- gate the influence of crystallinity and interface quality on hydrogen evolution reaction, ~10 nm-thick STO films were deposited via pulsed laser deposition (PLD) onto bare and reduced graphene oxide (rGO)-buffered Si substrates. The integration STO with Si was facilitated using SrO-assisted deoxidation and precise control the Si surface coverage with spin-coating of one to three graphene oxide layers (~50 - 100 % surface coverage). The STO films were grown at 515 and 700 °C, and characterized by reflection high-energy electron diffraction (RHEED), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray photoelectron spectroscopy (XPS). AFM and XRR revealed smoother morphology and lower roughness for STO films grown on rGO-buffered... Si. XRD showed that films grown at 700 °C developed a textured structure on both substrate types, while those grown at 515 °C on SrO/rGO-treated Si exhibited high crystallinity with strong (002) out-of-plane orientation. These results were supported by RHEED, which showed sharp streaks indicative the improved structural order on rGO-buffered substrates. Electrochemical measurements demonstrated that the epitaxial STO/rGO photocathodes had superior performance compared to non-epitaxial ones, with a lower onset potential (0.24 V vs. RHE) and a much higher photocurrent density (-28.78 mA cm-2 ), with improved long-term stability as confirmed by chronoamperometry (CA). In contrast, non-epitaxial samples and those with silicate/silicide interfacial layers, particularly at 700 °C, exhibited reduced activity and stability, as shown by electrochemical impedance spectroscopy (EIS). These results highlight the critical role of interfacial design, crystalline orientation, and growth temperature in optimizing PEC performance.

Source:
YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts, 2025, 72-72
Publisher:
  • Belgrade : Materials Research Society of Serbia
Funding / projects:
  • ASPIRE - Low-dimensional nanomaterials for energy storage and sensing applications: Innovation through synergy of action (RS-ScienceFundRS-Prizma2023_TT-6706)
Note:
  • Twenty-sixth annual conference on material science (YUCOMAT 2025), Herceg Novi, Montenegro, 1-5 September 2025.

ISBN: 978-86-919111-8-8

[ Google Scholar ]
Handle
https://hdl.handle.net/21.15107/rcub_vinar_16024
URI
https://vinar.vin.bg.ac.rs/handle/123456789/16024
Collections
  • Radovi istraživača
  • ASPIRE
Institution/Community
Vinča
TY  - CONF
AU  - Petković, Darija
AU  - Ho, Hsin-Chia
AU  - Kovač, Janez
AU  - Trstenjak, Urška
AU  - Vengust, Damjan
AU  - Jovanović, Sonja
AU  - Spreitzer, Matjaž
AU  - Jovanović, Zoran M.
PY  - 2025
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/16024
AB  - Strontium titanate (STO) thin films epitaxially grown on silicon (Si) substrates act as both protective and electroactive layers in photoelectrochemical (PEC) water splitting. To investi- gate the influence of crystallinity and interface quality on hydrogen evolution reaction, ~10 nm-thick STO films were deposited via pulsed laser deposition (PLD) onto bare and reduced graphene oxide (rGO)-buffered Si substrates. The integration STO with Si was facilitated using SrO-assisted deoxidation and precise control the Si surface coverage with spin-coating of one to three graphene oxide layers (~50 - 100 % surface coverage). The STO films were grown at 515 and 700 °C, and characterized by reflection high-energy electron diffraction (RHEED), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray photoelectron spectroscopy (XPS). AFM and XRR revealed smoother morphology and lower roughness for STO films grown on rGO-buffered Si. XRD showed that films grown at 700 °C developed a textured structure on both substrate types, while those grown at 515 °C on SrO/rGO-treated Si exhibited high crystallinity with strong (002) out-of-plane orientation. These results were supported by RHEED, which showed sharp streaks indicative the improved structural order on rGO-buffered substrates. Electrochemical measurements demonstrated that the epitaxial STO/rGO photocathodes had superior performance compared to non-epitaxial ones, with a lower onset potential (0.24 V vs. RHE) and a much higher photocurrent density (-28.78 mA cm-2 ), with improved long-term stability as confirmed by chronoamperometry (CA). In contrast, non-epitaxial samples and those with silicate/silicide interfacial layers, particularly at 700 °C, exhibited reduced activity and stability, as shown by electrochemical impedance spectroscopy (EIS). These results highlight the critical role of interfacial design, crystalline orientation, and growth temperature in optimizing PEC performance.
PB  - Belgrade : Materials Research Society of Serbia
C3  - YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts
T1  - PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction
SP  - 72
EP  - 72
UR  - https://hdl.handle.net/21.15107/rcub_vinar_16024
ER  - 
@conference{
author = "Petković, Darija and Ho, Hsin-Chia and Kovač, Janez and Trstenjak, Urška and Vengust, Damjan and Jovanović, Sonja and Spreitzer, Matjaž and Jovanović, Zoran M.",
year = "2025",
abstract = "Strontium titanate (STO) thin films epitaxially grown on silicon (Si) substrates act as both protective and electroactive layers in photoelectrochemical (PEC) water splitting. To investi- gate the influence of crystallinity and interface quality on hydrogen evolution reaction, ~10 nm-thick STO films were deposited via pulsed laser deposition (PLD) onto bare and reduced graphene oxide (rGO)-buffered Si substrates. The integration STO with Si was facilitated using SrO-assisted deoxidation and precise control the Si surface coverage with spin-coating of one to three graphene oxide layers (~50 - 100 % surface coverage). The STO films were grown at 515 and 700 °C, and characterized by reflection high-energy electron diffraction (RHEED), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray photoelectron spectroscopy (XPS). AFM and XRR revealed smoother morphology and lower roughness for STO films grown on rGO-buffered Si. XRD showed that films grown at 700 °C developed a textured structure on both substrate types, while those grown at 515 °C on SrO/rGO-treated Si exhibited high crystallinity with strong (002) out-of-plane orientation. These results were supported by RHEED, which showed sharp streaks indicative the improved structural order on rGO-buffered substrates. Electrochemical measurements demonstrated that the epitaxial STO/rGO photocathodes had superior performance compared to non-epitaxial ones, with a lower onset potential (0.24 V vs. RHE) and a much higher photocurrent density (-28.78 mA cm-2 ), with improved long-term stability as confirmed by chronoamperometry (CA). In contrast, non-epitaxial samples and those with silicate/silicide interfacial layers, particularly at 700 °C, exhibited reduced activity and stability, as shown by electrochemical impedance spectroscopy (EIS). These results highlight the critical role of interfacial design, crystalline orientation, and growth temperature in optimizing PEC performance.",
publisher = "Belgrade : Materials Research Society of Serbia",
journal = "YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts",
title = "PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction",
pages = "72-72",
url = "https://hdl.handle.net/21.15107/rcub_vinar_16024"
}
Petković, D., Ho, H., Kovač, J., Trstenjak, U., Vengust, D., Jovanović, S., Spreitzer, M.,& Jovanović, Z. M.. (2025). PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction. in YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts
Belgrade : Materials Research Society of Serbia., 72-72.
https://hdl.handle.net/21.15107/rcub_vinar_16024
Petković D, Ho H, Kovač J, Trstenjak U, Vengust D, Jovanović S, Spreitzer M, Jovanović ZM. PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction. in YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts. 2025;:72-72.
https://hdl.handle.net/21.15107/rcub_vinar_16024 .
Petković, Darija, Ho, Hsin-Chia, Kovač, Janez, Trstenjak, Urška, Vengust, Damjan, Jovanović, Sonja, Spreitzer, Matjaž, Jovanović, Zoran M., "PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction" in YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts (2025):72-72,
https://hdl.handle.net/21.15107/rcub_vinar_16024 .

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