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dc.creatorIlić, Stefan
dc.creatorAnđelković, Marko S.
dc.creatorCarvajal, Miguel A.
dc.creatorLallena, Antonio M.
dc.creatorKrstić, Miloš
dc.creatorStanković, Srboljub
dc.creatorRistić, Goran S.
dc.date.accessioned2021-12-16T08:32:49Z
dc.date.available2021-12-16T08:32:49Z
dc.date.issued2021
dc.identifier.isbn978-1-6654-4528-3
dc.identifier.issn2159-1660
dc.identifier.urihttps://vinar.vin.bg.ac.rs/handle/123456789/10020
dc.description.abstractIn this paper, the feasibility of using commercial power Silicon Carbide (SiC) Schottky diodes as a current mode γ-radiation detector have been examined. Diodes with almost identical electric characteristics are purchased from two different manufacturers, On Semiconductor and RoHM. They have been tested under gamma radiation exposure from a Co-60 source. The current response during irradiation has been measured for various dose rates with reversed diode bias. Investigated range of dose rates was from 0.258 Gy/h to 26.312 Gy/h, and reverse diode bias values were 10 V, 20 V, 50 V, 100 V and 200 V. Tested Schottky diodes produce stable current response for the investigated dose rates. Although the manufacturers are different, the results show that the dosimetric characteristics of these diodes have an excellent match. Sensitivity was proportional to the applied reverse bias voltage. A simple power-law can very well describe the dependence of measured radiation-induced current on dose rate.en
dc.relationinfo:eu-repo/grantAgreement/MESTD/inst-2020/200026/RS//
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/43011/RS//
dc.relationEuropean Commission [857558 - ELICSIR, WIDESPREAD-2018-3-TWINNING]
dc.rightsrestrictedAccess
dc.sourceMIEL 2021 : 32nd International Conference on Microelectronics : Proceedings
dc.subjectPower measurementen
dc.subjectRadiation effectsen
dc.subjectSchottky diodesen
dc.subjectSemiconductor device measurementen
dc.subjectSensitivityen
dc.subjectSilicon carbideen
dc.subjectVoltage measurementen
dc.titlePower Silicon Carbide Schottky Diodes as Current Mode γ - Radiation Detectors
dc.typeconferenceObject
dc.rights.licenseARR
dc.citation.spage337
dc.citation.epage340
dc.identifier.doi10.1109/MIEL52794.2021.9569076
dc.type.versionpublishedVersion
dc.identifier.scopus2-s2.0-85118457713


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