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PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction
| dc.creator | Petković, Darija | |
| dc.creator | Ho, Hsin-Chia | |
| dc.creator | Kovač, Janez | |
| dc.creator | Trstenjak, Urška | |
| dc.creator | Vengust, Damjan | |
| dc.creator | Jovanović, Sonja | |
| dc.creator | Spreitzer, Matjaž | |
| dc.creator | Jovanović, Zoran M. | |
| dc.date.accessioned | 2025-12-26T07:59:10Z | |
| dc.date.available | 2025-12-26T07:59:10Z | |
| dc.date.issued | 2025 | |
| dc.identifier.isbn | 978-86-919111-8-8 | |
| dc.identifier.uri | https://vinar.vin.bg.ac.rs/handle/123456789/16024 | |
| dc.description.abstract | Strontium titanate (STO) thin films epitaxially grown on silicon (Si) substrates act as both protective and electroactive layers in photoelectrochemical (PEC) water splitting. To investi- gate the influence of crystallinity and interface quality on hydrogen evolution reaction, ~10 nm-thick STO films were deposited via pulsed laser deposition (PLD) onto bare and reduced graphene oxide (rGO)-buffered Si substrates. The integration STO with Si was facilitated using SrO-assisted deoxidation and precise control the Si surface coverage with spin-coating of one to three graphene oxide layers (~50 - 100 % surface coverage). The STO films were grown at 515 and 700 °C, and characterized by reflection high-energy electron diffraction (RHEED), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray photoelectron spectroscopy (XPS). AFM and XRR revealed smoother morphology and lower roughness for STO films grown on rGO-buffered Si. XRD showed that films grown at 700 °C developed a textured structure on both substrate types, while those grown at 515 °C on SrO/rGO-treated Si exhibited high crystallinity with strong (002) out-of-plane orientation. These results were supported by RHEED, which showed sharp streaks indicative the improved structural order on rGO-buffered substrates. Electrochemical measurements demonstrated that the epitaxial STO/rGO photocathodes had superior performance compared to non-epitaxial ones, with a lower onset potential (0.24 V vs. RHE) and a much higher photocurrent density (-28.78 mA cm-2 ), with improved long-term stability as confirmed by chronoamperometry (CA). In contrast, non-epitaxial samples and those with silicate/silicide interfacial layers, particularly at 700 °C, exhibited reduced activity and stability, as shown by electrochemical impedance spectroscopy (EIS). These results highlight the critical role of interfacial design, crystalline orientation, and growth temperature in optimizing PEC performance. | en |
| dc.language.iso | en | |
| dc.publisher | Belgrade : Materials Research Society of Serbia | |
| dc.relation | info:eu-repo/grantAgreement/ScienceFundRS/Prizma2023_TT/6706/RS// | |
| dc.rights | openAccess | |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
| dc.source | YUCOMAT 2025 : 26th Jubilee Annual Conference YUCOMAT 2025 : Programme and The Book of Abstracts | en |
| dc.title | PLD-grown thin films of STO on silicon photocathodes for photoelectrochemical hydrogen evolution reaction | en |
| dc.type | conferenceObject | en |
| dc.rights.license | BY | |
| dc.citation.spage | 72 | |
| dc.citation.epage | 72 | |
| dc.description.other | Twenty-sixth annual conference on material science (YUCOMAT 2025), Herceg Novi, Montenegro, 1-5 September 2025. | en |
| dc.type.version | publishedVersion | |
| dc.identifier.fulltext | http://vinar.vin.bg.ac.rs/bitstream/id/45434/YUCOMAT_2025_BoA_72.pdf | |
| dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_vinar_16024 |
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