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Thermal characterization of n-type silicon based on an electro-acoustic analogy
| dc.creator | Stanojević, Neda | |
| dc.creator | Markushev, Dragana K. | |
| dc.creator | Aleksić, Sanja M. | |
| dc.creator | Pantić, Dragan S. | |
| dc.creator | Galović, Slobodanka | |
| dc.creator | Markushev, Dragan D. | |
| dc.creator | Ordonez-Miranda, Jose | |
| dc.date.accessioned | 2023-07-17T08:36:29Z | |
| dc.date.available | 2023-07-17T08:36:29Z | |
| dc.date.issued | 2023 | |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.uri | https://vinar.vin.bg.ac.rs/handle/123456789/11211 | |
| dc.description.abstract | Based on the analogy between resistor-capacitor (RC) filters and the thermoelastic component of a photoacoustic signal, the complex thermoelastic response of an open photoacoustic cell is described as a simple linear time-invariant system of a low-pass RC filter. This description is done by finding a linear relation between the thermoelastic cut-off frequency and sample material thickness within the range of 10-1000 μm. Based on the theory of a composite piston, we run numerical simulations of the proposed method for n-type silicon, described as either a surface or volume absorber. Theoretical predictions are experimentally validated by using an open photoacoustic cell setup to record the signal of an 850-μm-thick n-type silicon wafer illuminated by a blue light source modulated with frequencies from 20 Hz to 20 kHz. The obtained experimental results confirm the linear dependence of the thermoelastic cut-off frequency on the sample thickness, and, therefore, they lay the foundation of a new method for the thermal characterization of materials. © 2023 Author(s). | en |
| dc.language.iso | en | |
| dc.relation | Ministry of Science, Technological Development, and Innovations of the Republic of Serbia [660-01-00015/69] | |
| dc.rights | metadata only access | sr |
| dc.source | Journal of Applied Physics | |
| dc.subject | Frequency response | en |
| dc.subject | Invariance | en |
| dc.subject | Light sources | en |
| dc.subject | Linear time-invariant system | en |
| dc.subject | Silicon wafers | en |
| dc.subject | Thermoelasticity | en |
| dc.subject | Time varying control systems | en |
| dc.title | Thermal characterization of n-type silicon based on an electro-acoustic analogy | en |
| dc.type | article | en |
| dc.rights.license | ARR | |
| dc.citation.volume | 133 | |
| dc.citation.issue | 24 | |
| dc.citation.spage | 245102 | |
| dc.identifier.wos | 001019515900011 | |
| dc.identifier.doi | 10.1063/5.0152495 | |
| dc.citation.rank | M22 | |
| dc.description.other | Peer-reviewed manuscript: [https://vinar.vin.bg.ac.rs/handle/123456789/11212] | en |
| dc.type.version | publishedVersion | |
| dc.identifier.scopus | 2-s2.0-85163702415 |
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