Republic of Serbia [451-03-02328/2012-14/03], Republic of Portugal [451-03-02328/2012-14/03], Portuguese Research Grant through FCT-MEC [Pest-OE/FIS/UI0068/2011]

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Republic of Serbia [451-03-02328/2012-14/03], Republic of Portugal [451-03-02328/2012-14/03], Portuguese Research Grant through FCT-MEC [Pest-OE/FIS/UI0068/2011]

Authors

Publications

XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor

Radisavljević, Ivana; Trigueiro, J.; Bundaleski, Nenad; Medić, Mirjana; Romčević, Nebojša Ž.; Teodoro, Orlando M. N. D.; Mitrić, Miodrag; Ivanović, Nenad

(2015)

TY  - JOUR
AU  - Radisavljević, Ivana
AU  - Trigueiro, J.
AU  - Bundaleski, Nenad
AU  - Medić, Mirjana
AU  - Romčević, Nebojša Ž.
AU  - Teodoro, Orlando M. N. D.
AU  - Mitrić, Miodrag
AU  - Ivanović, Nenad
PY  - 2015
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/425
AB  - Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved.
T2  - Journal of Alloys and Compounds
T1  - XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor
VL  - 632
SP  - 17
EP  - 22
DO  - 10.1016/j.jallcom.2015.01.169
ER  - 
@article{
author = "Radisavljević, Ivana and Trigueiro, J. and Bundaleski, Nenad and Medić, Mirjana and Romčević, Nebojša Ž. and Teodoro, Orlando M. N. D. and Mitrić, Miodrag and Ivanović, Nenad",
year = "2015",
abstract = "Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved.",
journal = "Journal of Alloys and Compounds",
title = "XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor",
volume = "632",
pages = "17-22",
doi = "10.1016/j.jallcom.2015.01.169"
}
Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N. Ž., Teodoro, O. M. N. D., Mitrić, M.,& Ivanović, N.. (2015). XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. in Journal of Alloys and Compounds, 632, 17-22.
https://doi.org/10.1016/j.jallcom.2015.01.169
Radisavljević I, Trigueiro J, Bundaleski N, Medić M, Romčević NŽ, Teodoro OMND, Mitrić M, Ivanović N. XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. in Journal of Alloys and Compounds. 2015;632:17-22.
doi:10.1016/j.jallcom.2015.01.169 .
Radisavljević, Ivana, Trigueiro, J., Bundaleski, Nenad, Medić, Mirjana, Romčević, Nebojša Ž., Teodoro, Orlando M. N. D., Mitrić, Miodrag, Ivanović, Nenad, "XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor" in Journal of Alloys and Compounds, 632 (2015):17-22,
https://doi.org/10.1016/j.jallcom.2015.01.169 . .
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