XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor
Romčević, Nebojša Ž.
Teodoro, Orlando M. N. D.
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Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved.
Кључне речи:Semiconductors / Impurities in semiconductors / Photoelectron spectroscopies
Извор:Journal of Alloys and Compounds, 2015, 632, 17-22
- Оптоелектронски нанодимензиони системи - пут ка примени (RS-45003)
- ELISA - European Light Sources Activities - Synchrotrons and Free Electron Lasers (EU-226716)
- Republic of Serbia [451-03-02328/2012-14/03], Republic of Portugal [451-03-02328/2012-14/03], Portuguese Research Grant through FCT-MEC [Pest-OE/FIS/UI0068/2011]