Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles
Аутори
Antić, ŽeljkaPrashanthi, Kovur
Kuzman, Sanja
Periša, Jovana
Ristić, Zoran
Palkar, Vaijayanti R.
Dramićanin, Miroslav
Чланак у часопису (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO3semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO3nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (Sa) and the relative sensor sensitivity (Sr) and the temperature resolution (?Tm) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K-1and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors.
Извор:
RSC Advances, 2020, 10, 29, 16982-16986Финансирање / пројекти:
- NanoTBTech - Nanoparticles-based 2D thermal bioimaging technologies (EU-H2020-801305)
- Ministry of Education, Science and Technological Development of the Republic of Serbia
DOI: 10.1039/D0RA01896A
ISSN: 2046-2069
WoS: 000533969200020
Scopus: 2-s2.0-85084535718
Институција/група
VinčaTY - JOUR AU - Antić, Željka AU - Prashanthi, Kovur AU - Kuzman, Sanja AU - Periša, Jovana AU - Ristić, Zoran AU - Palkar, Vaijayanti R. AU - Dramićanin, Miroslav PY - 2020 UR - https://vinar.vin.bg.ac.rs/handle/123456789/8998 AB - A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO3semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO3nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (Sa) and the relative sensor sensitivity (Sr) and the temperature resolution (?Tm) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K-1and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors. T2 - RSC Advances T1 - Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles VL - 10 IS - 29 SP - 16982 EP - 16986 DO - 10.1039/D0RA01896A ER -
@article{ author = "Antić, Željka and Prashanthi, Kovur and Kuzman, Sanja and Periša, Jovana and Ristić, Zoran and Palkar, Vaijayanti R. and Dramićanin, Miroslav", year = "2020", abstract = "A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO3semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO3nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (Sa) and the relative sensor sensitivity (Sr) and the temperature resolution (?Tm) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K-1and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors.", journal = "RSC Advances", title = "Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles", volume = "10", number = "29", pages = "16982-16986", doi = "10.1039/D0RA01896A" }
Antić, Ž., Prashanthi, K., Kuzman, S., Periša, J., Ristić, Z., Palkar, V. R.,& Dramićanin, M.. (2020). Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles. in RSC Advances, 10(29), 16982-16986. https://doi.org/10.1039/D0RA01896A
Antić Ž, Prashanthi K, Kuzman S, Periša J, Ristić Z, Palkar VR, Dramićanin M. Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles. in RSC Advances. 2020;10(29):16982-16986. doi:10.1039/D0RA01896A .
Antić, Željka, Prashanthi, Kovur, Kuzman, Sanja, Periša, Jovana, Ristić, Zoran, Palkar, Vaijayanti R., Dramićanin, Miroslav, "Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles" in RSC Advances, 10, no. 29 (2020):16982-16986, https://doi.org/10.1039/D0RA01896A . .