Extraction of parameters from I-V data for nonideal photodetectors: A comparative study
Apstrakt
Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations.
Ključne reči:
I-V data / diode parameters / evaluation of methods / extractionsIzvor:
Materials Science Forum, 2005, 494, 83-88Napomena:
- Current Research in Advanced Materials and Processes, 6th Conference of the Yugoslav-Materials-Research-Society, Sep 13-17, 2004, Herceg Novi, Montenegro
Kolekcije
Institucija/grupa
VinčaTY - JOUR AU - Vasić, Aleksandra AU - Osmokrović, Predrag V. AU - Lončar, Boris B. AU - Stanković, Srboljub PY - 2005 UR - https://vinar.vin.bg.ac.rs/handle/123456789/6519 AB - Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations. T2 - Materials Science Forum T1 - Extraction of parameters from I-V data for nonideal photodetectors: A comparative study VL - 494 SP - 83 EP - 88 DO - 10.4028/www.scientific.net/MSF.494.83 ER -
@article{ author = "Vasić, Aleksandra and Osmokrović, Predrag V. and Lončar, Boris B. and Stanković, Srboljub", year = "2005", abstract = "Parameters that characterize semiconductor devices are often determined with difficulty, and their values very frequently depend on the method used for measurements and analysis. The extraction of diode parameters from the obtained I-V measurements could be complicated by their dependence on the voltage and the presence of series resistance. Therefore, an interpretation of the experimental I-V data must be very carefully made. In this paper, some methods for obtaining diode parameters such as saturation current, ideality factor and series resistance are presented. An evaluation of these methods based on their application for the extraction of the relevant parameters of photodiodes is also performed. Some of the methods that produce reliable and reproducible results are evaluated based on the experimentally obtained results, and in the view of the complexity of the used methods and their limitations.", journal = "Materials Science Forum", title = "Extraction of parameters from I-V data for nonideal photodetectors: A comparative study", volume = "494", pages = "83-88", doi = "10.4028/www.scientific.net/MSF.494.83" }
Vasić, A., Osmokrović, P. V., Lončar, B. B.,& Stanković, S.. (2005). Extraction of parameters from I-V data for nonideal photodetectors: A comparative study. in Materials Science Forum, 494, 83-88. https://doi.org/10.4028/www.scientific.net/MSF.494.83
Vasić A, Osmokrović PV, Lončar BB, Stanković S. Extraction of parameters from I-V data for nonideal photodetectors: A comparative study. in Materials Science Forum. 2005;494:83-88. doi:10.4028/www.scientific.net/MSF.494.83 .
Vasić, Aleksandra, Osmokrović, Predrag V., Lončar, Boris B., Stanković, Srboljub, "Extraction of parameters from I-V data for nonideal photodetectors: A comparative study" in Materials Science Forum, 494 (2005):83-88, https://doi.org/10.4028/www.scientific.net/MSF.494.83 . .