X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor
Apstrakt
Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu-25 [AsSe1.4I0.2](75) amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units.
Ključne reči:
amorphous semiconductor / radial distribution function / short-range order / structure factorIzvor:
Materials Science Forum, 2001, 378-3, 394-399Napomena:
- 7th European Powder Diffraction Conference (EPDIC 7), May 20-23, 2000, Barcelona, Spain
DOI: 10.4028/www.scientific.net/MSF.378-381.394
ISSN: 0255-5476
WoS: 000172514200063
[ Google Scholar ]Kolekcije
Institucija/grupa
VinčaTY - JOUR AU - Bordas, A AU - Vučinić-Vasić, Milica AU - Kapor, Agneš AU - Antić, Bratislav PY - 2001 UR - https://vinar.vin.bg.ac.rs/handle/123456789/6324 AB - Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu-25 [AsSe1.4I0.2](75) amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units. T2 - Materials Science Forum T1 - X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor VL - 378-3 SP - 394 EP - 399 DO - 10.4028/www.scientific.net/MSF.378-381.394 ER -
@article{ author = "Bordas, A and Vučinić-Vasić, Milica and Kapor, Agneš and Antić, Bratislav", year = "2001", abstract = "Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu-25 [AsSe1.4I0.2](75) amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units.", journal = "Materials Science Forum", title = "X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor", volume = "378-3", pages = "394-399", doi = "10.4028/www.scientific.net/MSF.378-381.394" }
Bordas, A., Vučinić-Vasić, M., Kapor, A.,& Antić, B.. (2001). X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor. in Materials Science Forum, 378-3, 394-399. https://doi.org/10.4028/www.scientific.net/MSF.378-381.394
Bordas A, Vučinić-Vasić M, Kapor A, Antić B. X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor. in Materials Science Forum. 2001;378-3:394-399. doi:10.4028/www.scientific.net/MSF.378-381.394 .
Bordas, A, Vučinić-Vasić, Milica, Kapor, Agneš, Antić, Bratislav, "X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor" in Materials Science Forum, 378-3 (2001):394-399, https://doi.org/10.4028/www.scientific.net/MSF.378-381.394 . .