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Raman spectroscopy study of graphene thin films synthesized from solid precursor

Authorized Users Only
2016
Authors
Prekodravac, Jovana
Marković, Zoran M.
Jovanović, Svetlana P.
Holclajtner-Antunović, Ivanka D.
Pavlović, Vladimir B.
Todorović-Marković, Biljana
Article (Published version)
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Abstract
In this work, we present Raman spectroscopy study of graphene thin films obtained by rapid thermal annealing in vacuum. As a carbon source, we used spectroscopic graphite electrodes cut into small pieces on top of which we deposited copper/nickel thin films. Samples were then annealed at different annealing temperatures (600, 700, 800 and 900 degrees C) for 30 min. Raman spectroscopy study showed that annealing at lower annealing temperatures (600 and 700 degrees C) leads to formation of single layer graphene thin films with relatively high level of defects. Annealing at higher annealing temperatures (800 and 900 degrees C), on the other hand, resulted in formation of homogenous multilayer graphene thin films. From Raman spectra, we also concluded that samples annealed at higher annealing temperatures had lower level of defects compared to the samples annealed at lower annealing temperatures.
Keywords:
Graphene / Rapid thermal annealing / Raman spectroscopy
Source:
Optical and Quantum Electronics, 2016, 48, 2
Publisher:
  • Springer
Funding / projects:
  • Thin films of single wall carbon nanotubes and graphene for electronic application (RS-172003)
  • bilateral Project Serbia-Slovakia [SK-SRB-2013-0044, 451-03-545/2015-09/07]

DOI: 10.1007/s11082-016-0385-5

ISSN: 0306-8919; 1572-817X

WoS: 000368741200039

Scopus: 2-s2.0-84955304797
[ Google Scholar ]
9
4
URI
https://vinar.vin.bg.ac.rs/handle/123456789/903
Collections
  • WoS Import
Institution/Community
Vinča
TY  - JOUR
AU  - Prekodravac, Jovana
AU  - Marković, Zoran M.
AU  - Jovanović, Svetlana P.
AU  - Holclajtner-Antunović, Ivanka D.
AU  - Pavlović, Vladimir B.
AU  - Todorović-Marković, Biljana
PY  - 2016
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/903
AB  - In this work, we present Raman spectroscopy study of graphene thin films obtained by rapid thermal annealing in vacuum. As a carbon source, we used spectroscopic graphite electrodes cut into small pieces on top of which we deposited copper/nickel thin films. Samples were then annealed at different annealing temperatures (600, 700, 800 and 900 degrees C) for 30 min. Raman spectroscopy study showed that annealing at lower annealing temperatures (600 and 700 degrees C) leads to formation of single layer graphene thin films with relatively high level of defects. Annealing at higher annealing temperatures (800 and 900 degrees C), on the other hand, resulted in formation of homogenous multilayer graphene thin films. From Raman spectra, we also concluded that samples annealed at higher annealing temperatures had lower level of defects compared to the samples annealed at lower annealing temperatures.
PB  - Springer
T2  - Optical and Quantum Electronics
T1  - Raman spectroscopy study of graphene thin films synthesized from solid precursor
VL  - 48
IS  - 2
DO  - 10.1007/s11082-016-0385-5
ER  - 
@article{
author = "Prekodravac, Jovana and Marković, Zoran M. and Jovanović, Svetlana P. and Holclajtner-Antunović, Ivanka D. and Pavlović, Vladimir B. and Todorović-Marković, Biljana",
year = "2016",
abstract = "In this work, we present Raman spectroscopy study of graphene thin films obtained by rapid thermal annealing in vacuum. As a carbon source, we used spectroscopic graphite electrodes cut into small pieces on top of which we deposited copper/nickel thin films. Samples were then annealed at different annealing temperatures (600, 700, 800 and 900 degrees C) for 30 min. Raman spectroscopy study showed that annealing at lower annealing temperatures (600 and 700 degrees C) leads to formation of single layer graphene thin films with relatively high level of defects. Annealing at higher annealing temperatures (800 and 900 degrees C), on the other hand, resulted in formation of homogenous multilayer graphene thin films. From Raman spectra, we also concluded that samples annealed at higher annealing temperatures had lower level of defects compared to the samples annealed at lower annealing temperatures.",
publisher = "Springer",
journal = "Optical and Quantum Electronics",
title = "Raman spectroscopy study of graphene thin films synthesized from solid precursor",
volume = "48",
number = "2",
doi = "10.1007/s11082-016-0385-5"
}
Prekodravac, J., Marković, Z. M., Jovanović, S. P., Holclajtner-Antunović, I. D., Pavlović, V. B.,& Todorović-Marković, B.. (2016). Raman spectroscopy study of graphene thin films synthesized from solid precursor. in Optical and Quantum Electronics
Springer., 48(2).
https://doi.org/10.1007/s11082-016-0385-5
Prekodravac J, Marković ZM, Jovanović SP, Holclajtner-Antunović ID, Pavlović VB, Todorović-Marković B. Raman spectroscopy study of graphene thin films synthesized from solid precursor. in Optical and Quantum Electronics. 2016;48(2).
doi:10.1007/s11082-016-0385-5 .
Prekodravac, Jovana, Marković, Zoran M., Jovanović, Svetlana P., Holclajtner-Antunović, Ivanka D., Pavlović, Vladimir B., Todorović-Marković, Biljana, "Raman spectroscopy study of graphene thin films synthesized from solid precursor" in Optical and Quantum Electronics, 48, no. 2 (2016),
https://doi.org/10.1007/s11082-016-0385-5 . .

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