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dc.creatorButenko, A V
dc.creatorSyresin, E M
dc.creatorTyutyunnikov, S I
dc.creatorBatyaev, V F
dc.creatorKulevoy, T V
dc.creatorPavlov, K V
dc.creatorRogov, V I
dc.creatorTitarenko, A. Yu.
dc.creatorTitarenko, Yu. E
dc.creatorBerlyand, A. V.
dc.creatorBerlyand, V A
dc.creatorSobolevskiy, N M
dc.creatorBobrovskiy, D V
dc.creatorChumakov, A I
dc.creatorSaburov, V O
dc.creatorSoloviev, A N
dc.creatorPešić, Milan P.
dc.date.accessioned2020-09-08T09:43:10Z
dc.date.available2020-09-08T09:43:10Z
dc.date.issued2019
dc.identifier.issn1547-4771
dc.identifier.urihttps://vinar.vin.bg.ac.rs/handle/123456789/8787
dc.description.abstractAbstract: The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micromechanical systems are considered. One of the main requirements for such beams is ensuring the desired range of linear energy transfer (LET). Two methods for changing the LET are considered, one of which is based on using the ions of various types (16O, 22Ne, 40Ar, 56Fe, 84Kr, 136Xe, 209Bi), and the other is based on using ion of the same type (197Au), but with different energies. The advantages of using both methods are considered and the problems arising when using the second method are analyzed. © 2019, Pleiades Publishing, Ltd.en
dc.language.isoen
dc.rightsrestrictedAccess
dc.sourcePhysics of Particles and Nuclei Letters
dc.titleAnalysis of Metrological Provision Problems of a Test Stand for Testing Radio-Electronic Products for Resistance to Irradiation with High-Energy Heavy Ionsen
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractСоболевскиy, Н М; Соловиев, A Н; Пешић, Милан П.; Бутенко, A В; Сyресин, Е М; Тyутyунников, С И; Батyаев, В Ф; Кулевоy, Т В; Павлов, К В; Рогов, В И; Титаренко, A. Yу.; Титаренко, Yу. Е; Берлyанд, A. В.; Берлyанд, В A; Бобровскиy, Д В; Цхумаков, A И; Сабуров, В О;
dc.rights.holder© 2019, Pleiades Publishing, Ltd
dc.citation.volume16
dc.citation.issue6
dc.citation.spage734
dc.citation.epage743
dc.identifier.doi10.1134/S1547477119060098
dc.type.versionpublishedVersion
dc.identifier.scopus2-s2.0-85077024596


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