Surface Texture Parameters in Optimizing Magnetic Force Images
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In this work, the optimizing conditions necessary for magnetic field gradient imaging using Atomic Force Microscopy (AFM) and Magnetic Force Microscopy (MFM) in a lift mode have been established. 55 nm thick Co thin film deposited on monocrystalline silicon substrate was used as a sample. The lift height dependence of various surface texture parameters: R-sk - the skewness, and R-ku - the kurtosis, have been determined. The results have shown that the influence of the substrate and its texture on the magnetic field gradient can be neglected for the lift height above 40 am, and that the tipper lift height limit corresponding to the height where magnetic field lines follow the shape of the field is 100 nm.
Source:2008, 84, 197-+
- Publications of the Astronomical Observatory of Belgrade Series, 24th Summer School and International Symposium on Physics of Ionized Gases, Aug 25-29, 2008, Novi Sad, Serbia