Structural and Magnetic Properites of Xe Ion Irradiated Co/Si Bilayers
Novaković, Mirjana M.
Bibić, Nataša M.
Rakočević, Zlatko Lj.
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Polycrystalline cobalt layers, deposited on Si(110) wafers via electron beam evaporation to a thickness of 55 nm, were irradiated at room temperature with 200 keV Xe ions to fluences of tip to 15 x 10(15) ions/cm(2). The atomic and magnetic force microscopy (AFM and MFM) were used to investigate the changes in the roughness and magnetic properties of the Co/Si bilayers. Ion beam induced structural changes were correlated with magnetic properties.
Source:2008, 84, 193-196
- Publications of the Astronomical Observatory of Belgrade Series, 24th Summer School and International Symposium on Physics of Ionized Gases, Aug 25-29, 2008, Novi Sad, Serbia