Highly charged ion beam diagnostics at the mVINIS Ion Source
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In order to determine position, dimensions and intensities of multiply charged ion beams at the mVINIS Ion Source, a novel method was developed based on a fluorescent screen and a commercial digital TV camera. The spatial characteristics of multiply charged ion beams (for example the ionization states of Ar (2+) to Ar10+) have been precisely measured and analyzed at the TESLA Accelerator Installation for the first time. In this work, we discuss in details the characteristics of Ar (8+) ion beams. The obtained ion beam characteristics were compared with the results of previously applied conventional methods of ion beam diagnostics.
Source:Journal of Physics: Conference Series, 2007, 58, 423-+
- 13th International Conference on Physics of Highly Charged Ions, Aug 28-Sep 01, 2006, Queens Univ, Belfast, Ireland