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The innovative method for determining characteristics of over-voltage protection elements
dc.creator | Osmokrović, Predrag V. | |
dc.creator | Lončar, Boris B. | |
dc.creator | Stanković, Srboljub | |
dc.creator | Vasić, Aleksandra | |
dc.date.accessioned | 2018-03-03T14:17:19Z | |
dc.date.available | 2018-03-03T14:17:19Z | |
dc.date.issued | 2006 | |
dc.identifier.issn | 2159-1660 | |
dc.identifier.uri | https://vinar.vin.bg.ac.rs/handle/123456789/6590 | |
dc.description.abstract | This paper presents an innovative method for efficient characterization of relevant characteristics of non-linear over-voltage protection elements in low-voltage applications. Standard measuring equipment is modified to enable an efficient and repeatable experimental procedure to investigate characteristics of over-voltage diodes and varistors: volt-ampere characteristic, volt-ohm characteristic, coefficient of non-linearity, and finally, the breakdown voltage. Additionally, an innovative aging estimate algorithm was used. Furthermore, the pseudo-empiric method using the area law is used to determine an impulse characteristic of a gas filled surge arrester (GFSA). Suggested experimental procedure offers higher measuring accuracy and repeatability because internal temperature of non-linear elements is virtually unchanged during all experiments. All experimental results are treated statistically to prove high repeatability of suggested approach. Comparison of results obtained by suggested experimental method and classical approach, shows minimal discrepancies. | en |
dc.publisher | IEEE Computer Society | |
dc.relation | Ministry of Science and Environmental Protection of Republic of Serbia | |
dc.rights | restrictedAccess | en |
dc.source | MIEL : 25th International Conference on Microelectronics | |
dc.title | The innovative method for determining characteristics of over-voltage protection elements | en |
dc.type | conferenceObject | en |
dc.rights.license | ARR | |
dcterms.abstract | Станковиц, С. Ј.; Васиц, A.; Лонцар, Б.; Осмокровиц, П.; | |
dc.citation.spage | 693 | |
dc.identifier.wos | 000238839700145 | |
dc.identifier.doi | 10.1109/ICMEL.2006.1651052 | |
dc.description.other | International Conference on Microelectronics-MIEL, 25th International Conference on Microelectronics, May 14-17, 2006, Belgrade, Serbia | en |
dc.type.version | publishedVersion | |
dc.identifier.scopus | 2-s2.0-77956554250 | |
dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_vinar_6590 |
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