Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range
Апстракт
Paper presents results of measuring thermal diffusivity of translucent or partially transparent thin discs of non-metals such as alumina and silicon using most widely spread experimental technique, the standard laser pulse method. Difficulties in its application to such materials are discussed. The thermal diffusivity has been measured from room temperature up to 900 degrees C for alumina, and to 1200 degrees C for silicon. Obtained results are analyzed and compared with available literature data and existing recommended functions.
Кључне речи:
thermal diffusivity / laser flash method / thermophysical properties / translucent materials / transparent materials / standard reference materialsИзвор:
Thermal Science, 2010, 14, 2, 417-423Финансирање / пројекти:
- Ministry of Science and Technological Development of Serbia
DOI: 10.2298/TSCI1002417M
ISSN: 0354-9836
WoS: 000279328200011
Scopus: 2-s2.0-77955902063
Колекције
Институција/група
VinčaTY - JOUR AU - Milošević, Nenad D. PY - 2010 UR - https://vinar.vin.bg.ac.rs/handle/123456789/3947 AB - Paper presents results of measuring thermal diffusivity of translucent or partially transparent thin discs of non-metals such as alumina and silicon using most widely spread experimental technique, the standard laser pulse method. Difficulties in its application to such materials are discussed. The thermal diffusivity has been measured from room temperature up to 900 degrees C for alumina, and to 1200 degrees C for silicon. Obtained results are analyzed and compared with available literature data and existing recommended functions. T2 - Thermal Science T1 - Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range VL - 14 IS - 2 SP - 417 EP - 423 DO - 10.2298/TSCI1002417M ER -
@article{ author = "Milošević, Nenad D.", year = "2010", abstract = "Paper presents results of measuring thermal diffusivity of translucent or partially transparent thin discs of non-metals such as alumina and silicon using most widely spread experimental technique, the standard laser pulse method. Difficulties in its application to such materials are discussed. The thermal diffusivity has been measured from room temperature up to 900 degrees C for alumina, and to 1200 degrees C for silicon. Obtained results are analyzed and compared with available literature data and existing recommended functions.", journal = "Thermal Science", title = "Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range", volume = "14", number = "2", pages = "417-423", doi = "10.2298/TSCI1002417M" }
Milošević, N. D.. (2010). Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range. in Thermal Science, 14(2), 417-423. https://doi.org/10.2298/TSCI1002417M
Milošević ND. Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range. in Thermal Science. 2010;14(2):417-423. doi:10.2298/TSCI1002417M .
Milošević, Nenad D., "Application of the Laser Pulse Method of Measuring Thermal Diffusivity to Thin Alumina and Silicon Samples in a Wide Temperature Range" in Thermal Science, 14, no. 2 (2010):417-423, https://doi.org/10.2298/TSCI1002417M . .