Show simple item record

dc.creatorRadmilovi-Radjenovic, Marija
dc.creatorRadjenovic, Branislav
dc.date.accessioned2018-03-01T20:14:35Z
dc.date.available2018-03-01T20:14:35Z
dc.date.issued2007
dc.identifier.issn0093-3813 (print)
dc.identifier.urihttp://vinar.vin.bg.ac.rs/handle/123456789/3317
dc.description.abstractDevices with micrometer and submicrometer gaps can face a serious challenge due to electrical breakdown during manufacturing, handling, and operation. Therefore, it is necessary to be aware of the breakdown voltage at different gaps. Since the Paschens law is not valid for gaps smaller than several micrometers, modified Paschen curve should be used to predict breakdown voltage for microdevices. One of the possible mechanisms responsible for the reduction of the maximum operation voltage at small gaps is the field emission (FE). In this paper, particle-in-cell/Monte Carlo collision simulations, including the ejection of electrons from the cathode due to a high electric field, have been carried out to estimate the significance of the FE effect on the breakdown voltage in microgaps.en
dc.rightsrestrictedAccessen
dc.sourceIEEE Transactions on Plasma Scienceen
dc.subjectfield emission (FE)en
dc.subjectmicrodischargesen
dc.subjectmicrogapen
dc.subjectsimulationen
dc.titleA particle-in-cell simulation of the high-field effect in devices with micrometer gapsen
dc.typearticleen
dcterms.abstractРадмилови-Радјеновиц, Марија; Радјеновиц, Бранислав;
dc.citation.volume35
dc.citation.issue5
dc.citation.spage1223
dc.citation.epage1228
dc.identifier.wos000250993200006
dc.identifier.doi10.1109/TPS.2007.906125
dc.citation.otherPart number: 1
dc.citation.rankM23
dc.identifier.scopus2-s2.0-35348854388


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record