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dc.creatorBussoli, Marco
dc.creatorBatani, Dimitri
dc.creatorDesai, Tara
dc.creatorCanova, Federico
dc.creatorMilani, Marziale
dc.creatorTrtica, Milan
dc.creatorGaković, Biljana M.
dc.creatorKrousky, Edouard
dc.date.accessioned2018-03-01T20:02:18Z
dc.date.available2018-03-01T20:02:18Z
dc.date.issued2007
dc.identifier.issn0263-0346 (print)
dc.identifier.urihttp://vinar.vin.bg.ac.rs/handle/123456789/3173
dc.description.abstractWe propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.en
dc.rightsrestrictedAccessen
dc.sourceLaser and Particle Beamsen
dc.subjectelectron emission relaxation regionen
dc.subjection fluxen
dc.subjectlaser plasma generationen
dc.subjectlaser poweren
dc.subjectplasma heatingen
dc.subjectplasma interactionen
dc.subjecttarget heatingen
dc.titleStudy of laser induced ablation with focused ion beam/scanning electron microscope devicesen
dc.typearticleen
dcterms.abstractБатани, Димитри; Десаи, Тара; Буссоли, Марцо; Милани, Марзиале; Цанова, Федерицо; Кроускy, Едоуард; Тртица Милан; Гаковић Биљана М;
dc.citation.volume25
dc.citation.issue1
dc.citation.spage121
dc.citation.epage125
dc.identifier.wos000245140400018
dc.identifier.doi10.1017/S0263034607070139
dc.citation.rankM21a
dc.identifier.scopus2-s2.0-33947362034


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