Study of laser induced ablation with focused ion beam/scanning electron microscope devices
Нема приказа
Аутори
Bussoli, MarcoBatani, Dimitri
Desai, Tara
Canova, Federico
Milani, Marziale
Trtica, Milan
Gaković, Biljana M.
Krousky, Edouard
Чланак у часопису
Метаподаци
Приказ свих података о документуАпстракт
We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.
Кључне речи:
electron emission relaxation region / ion flux / laser plasma generation / laser power / plasma heating / plasma interaction / target heatingИзвор:
Laser and Particle Beams, 2007, 25, 1, 121-125
DOI: 10.1017/S0263034607070139
ISSN: 0263-0346
WoS: 000245140400018
Scopus: 2-s2.0-33947362034
Колекције
Институција/група
VinčaTY - JOUR AU - Bussoli, Marco AU - Batani, Dimitri AU - Desai, Tara AU - Canova, Federico AU - Milani, Marziale AU - Trtica, Milan AU - Gaković, Biljana M. AU - Krousky, Edouard PY - 2007 UR - https://vinar.vin.bg.ac.rs/handle/123456789/3173 AB - We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique. T2 - Laser and Particle Beams T1 - Study of laser induced ablation with focused ion beam/scanning electron microscope devices VL - 25 IS - 1 SP - 121 EP - 125 DO - 10.1017/S0263034607070139 ER -
@article{ author = "Bussoli, Marco and Batani, Dimitri and Desai, Tara and Canova, Federico and Milani, Marziale and Trtica, Milan and Gaković, Biljana M. and Krousky, Edouard", year = "2007", abstract = "We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.", journal = "Laser and Particle Beams", title = "Study of laser induced ablation with focused ion beam/scanning electron microscope devices", volume = "25", number = "1", pages = "121-125", doi = "10.1017/S0263034607070139" }
Bussoli, M., Batani, D., Desai, T., Canova, F., Milani, M., Trtica, M., Gaković, B. M.,& Krousky, E.. (2007). Study of laser induced ablation with focused ion beam/scanning electron microscope devices. in Laser and Particle Beams, 25(1), 121-125. https://doi.org/10.1017/S0263034607070139
Bussoli M, Batani D, Desai T, Canova F, Milani M, Trtica M, Gaković BM, Krousky E. Study of laser induced ablation with focused ion beam/scanning electron microscope devices. in Laser and Particle Beams. 2007;25(1):121-125. doi:10.1017/S0263034607070139 .
Bussoli, Marco, Batani, Dimitri, Desai, Tara, Canova, Federico, Milani, Marziale, Trtica, Milan, Gaković, Biljana M., Krousky, Edouard, "Study of laser induced ablation with focused ion beam/scanning electron microscope devices" in Laser and Particle Beams, 25, no. 1 (2007):121-125, https://doi.org/10.1017/S0263034607070139 . .