The Impact of Radiation on Semiconducting Characteristics of Monocrystalline Silicon and Germanium
MetadataShow full item record
The paper examines the effects of radiation on the electrical characteristics of monocrystalline silicon and germanium. Samples of monocrystalline silicon and germanium are irradiated under controlled laboratory conditions in the field of neutron, X- and gamma-radiation. Change of the samples specific resistance was measured dependent on the radiation dose with the type of radiation as a parameter. Next, the dependence of the samples resistance on temperature was recorded (in the impurities region and in intrinsic region) with the previously absorbed dose as a parameter. The results were statistically analyzed and explained on the basis of radiation effects in solids. The results are compared with those obtained by using Monte Carlo method. A good agreement was confirmed by the mentioned experimental investigation.
Keywords:neutron radiation / X-radiation / gamma radiation / silicon / germanium / radiation effects / Monte-Carlo method
Source:Nuclear technology and radiation protection, 2016, 31, 1, 97-101
Showing items related by title, author, creator and subject.
Quality control in radiation processing in the Vinča Institute Radiation Plant: Case study / Kontrola kvaliteta u tehnologiji obrade zračenjem - studija slučaja Radijacione jedinice u Institutu 'Vinča' Šećerov, Bojana; Stančov, Danijela; Radenković, Mirjana; Dramićanin, Miroslav (Facta universitatis - series: Physics, Chemistry and Technology, 2016)
Korelacija radijacionih parametara i količine padavina prilikom monitoringa radioaktivnosti u okolini nuklearnih objekata / Correlation of radiation parameters and rainfall during environmental radiation monitoring around nuclear facilities Radumilo, Vesna; Knežević, Ivan; Žarković, Dragana; Arbutina, Dalibor (Београд : Институт за нуклеарне науке "Винча" : Друштво за заштиту од зрачења Србије и Црне Горе, 2017)
Comparison of Radiation Characteristics of HfO2 and SiO2 Incorporated in MOS Capacitor in Field of Gamma and X Radiation Stanković, Srboljub J.; Nikolić, Dragana; Kržanović, Nikola; Nađđerđ, Laslo; Davidović, Vojkan S. (IEEE, 2019)