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Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques
dc.creator | Jokanović, Vukoman R. | |
dc.creator | Bundaleski, Nenad | |
dc.creator | Petrović, Božana | |
dc.creator | Ferarra, Manuela | |
dc.creator | Jokanović, Bojan | |
dc.creator | Živković, Slavoljub | |
dc.creator | Nasov, Ilija | |
dc.date.accessioned | 2021-12-16T10:01:16Z | |
dc.date.available | 2021-12-16T10:01:16Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0042-207X | |
dc.identifier.uri | https://vinar.vin.bg.ac.rs/handle/123456789/10029 | |
dc.description.abstract | Thin films on the base of titanium oxynitrides and copper doped titanium nitride were obtained by a combination of different PVD techniques on the surface of glass substrate and their physicochemical properties were analyzed in details. Phase composition of the samples was analyzed by XRD and FTIR methods, while microstructure of the samples was analyzed by SEM. XPS was used for depth profiling of the samples, which enabled determination of the oxidative state of titanium and corresponding phases through various film layers from the surface to the substrate. The depth of the various layers and their extinction coefficients and refractory indexes were estimated by spectroscopic ellipsometry. | en |
dc.language | en | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/172026/RS// | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS// | |
dc.relation | Ministry of Education, Science and Technological Development of the Republic of Serbia [Theme 0402108] | |
dc.relation | Portuguese National Funding Agency for Science, Research and Technology [UID/FIS/00068/2019] | |
dc.rights | restrictedAccess | |
dc.source | Vacuum | |
dc.subject | Ellipsometry | en |
dc.subject | FTIR | en |
dc.subject | SEM | en |
dc.subject | Titanium thin films | en |
dc.subject | XPS | en |
dc.subject | XRD | en |
dc.title | Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques | en |
dc.type | article | en |
dc.rights.license | ARR | |
dc.citation.volume | 195 | |
dc.citation.spage | 110708 | |
dc.identifier.wos | 000733006900005 | |
dc.identifier.doi | 10.1016/j.vacuum.2021.110708 | |
dc.type.version | publishedVersion | |
dc.identifier.scopus | 2-s2.0-85118536987 |
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