TY  - JOUR
AU  - Jokanović, Vukoman R.
AU  - Bundaleski, Nenad
AU  - Petrović, Božana
AU  - Ferarra, Manuela
AU  - Jokanović, Bojan
AU  - Živković, Slavoljub
AU  - Nasov, Ilija
PY  - 2022
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/10029
AB  - Thin films on the base of titanium oxynitrides and copper doped titanium nitride were obtained by a combination of different PVD techniques on the surface of glass substrate and their physicochemical properties were analyzed in details. Phase composition of the samples was analyzed by XRD and FTIR methods, while microstructure of the samples was analyzed by SEM. XPS was used for depth profiling of the samples, which enabled determination of the oxidative state of titanium and corresponding phases through various film layers from the surface to the substrate. The depth of the various layers and their extinction coefficients and refractory indexes were estimated by spectroscopic ellipsometry.
T2  - Vacuum
T1  - Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques
VL  - 195
SP  - 110708
DO  - 10.1016/j.vacuum.2021.110708
ER  - 

@article{
author = "Jokanović, Vukoman R. and Bundaleski, Nenad and Petrović, Božana and Ferarra, Manuela and Jokanović, Bojan and Živković, Slavoljub and Nasov, Ilija",
year = "2022",
abstract = "Thin films on the base of titanium oxynitrides and copper doped titanium nitride were obtained by a combination of different PVD techniques on the surface of glass substrate and their physicochemical properties were analyzed in details. Phase composition of the samples was analyzed by XRD and FTIR methods, while microstructure of the samples was analyzed by SEM. XPS was used for depth profiling of the samples, which enabled determination of the oxidative state of titanium and corresponding phases through various film layers from the surface to the substrate. The depth of the various layers and their extinction coefficients and refractory indexes were estimated by spectroscopic ellipsometry.",
journal = "Vacuum",
title = "Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques",
volume = "195",
pages = "110708",
doi = "10.1016/j.vacuum.2021.110708"
}

Jokanović, V. R., Bundaleski, N., Petrović, B., Ferarra, M., Jokanović, B., Živković, S.,& Nasov, I.. (2022). Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques. in Vacuum, 195, 110708.
https://doi.org/10.1016/j.vacuum.2021.110708

Jokanović VR, Bundaleski N, Petrović B, Ferarra M, Jokanović B, Živković S, Nasov I. Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques. in Vacuum. 2022;195:110708.
doi:10.1016/j.vacuum.2021.110708 .

Jokanović, Vukoman R., Bundaleski, Nenad, Petrović, Božana, Ferarra, Manuela, Jokanović, Bojan, Živković, Slavoljub, Nasov, Ilija, "Detailed phisyco-chemical characterization of the multilayered thin films based on titanium oxynitride and copper doped titanium nitride obtained by different PVD techniques" in Vacuum, 195 (2022):110708,
https://doi.org/10.1016/j.vacuum.2021.110708 . .

TY  - JOUR
AU  - Jokanović, Vukoman R.
AU  - Bundaleski, Nenad
AU  - Čolović, Božana M.
AU  - Ferarra, Manuela
AU  - Jokanović, Bojan
AU  - Nasov, Ilija
PY  - 2021
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/9891
AB  - Physicochemical properties of thin films on the base of titanium oxides, obtained by a cathodic arc evaporation on the surface of glass substrate are analysed in details. The analysis of these films was made by using XRD, FTIR, SEM, XPS analysis and ellipsometry. On the basis of these analyses, particularly analysis obtained by XPS, the oxidative state Ti and corresponding phases are determined through various film layers from the surface to the substrate. The depth of the various levels and their extinction coefficients and refractory indexes are estimated by ellipsometry.
T2  - Zaštita materijala
T1  - Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation
VL  - 62
IS  - 1
SP  - 41
EP  - 50
DO  - 10.5937/zasmat2101041J
ER  - 

@article{
author = "Jokanović, Vukoman R. and Bundaleski, Nenad and Čolović, Božana M. and Ferarra, Manuela and Jokanović, Bojan and Nasov, Ilija",
year = "2021",
abstract = "Physicochemical properties of thin films on the base of titanium oxides, obtained by a cathodic arc evaporation on the surface of glass substrate are analysed in details. The analysis of these films was made by using XRD, FTIR, SEM, XPS analysis and ellipsometry. On the basis of these analyses, particularly analysis obtained by XPS, the oxidative state Ti and corresponding phases are determined through various film layers from the surface to the substrate. The depth of the various levels and their extinction coefficients and refractory indexes are estimated by ellipsometry.",
journal = "Zaštita materijala",
title = "Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation",
volume = "62",
number = "1",
pages = "41-50",
doi = "10.5937/zasmat2101041J"
}

Jokanović, V. R., Bundaleski, N., Čolović, B. M., Ferarra, M., Jokanović, B.,& Nasov, I.. (2021). Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation. in Zaštita materijala, 62(1), 41-50.
https://doi.org/10.5937/zasmat2101041J

Jokanović VR, Bundaleski N, Čolović BM, Ferarra M, Jokanović B, Nasov I. Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation. in Zaštita materijala. 2021;62(1):41-50.
doi:10.5937/zasmat2101041J .

Jokanović, Vukoman R., Bundaleski, Nenad, Čolović, Božana M., Ferarra, Manuela, Jokanović, Bojan, Nasov, Ilija, "Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation" in Zaštita materijala, 62, no. 1 (2021):41-50,
https://doi.org/10.5937/zasmat2101041J . .

TY  - JOUR
AU  - Medić-Ilić, Mirjana
AU  - Bundaleski, Nenad
AU  - Ivanović, Nenad
AU  - Teodoro, Orlando M. N. D.
AU  - Rakočević, Zlatko Lj.
AU  - Minić, Dragica M.
AU  - Romčević, Nebojša Ž.
AU  - Radisavljević, Ivana
PY  - 2020
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/8910
AB  - Recently introduced model for quantitative analysis of in-depth non-uniform surfaces is applied to reexamine the X-ray Photoelectron Spectroscopy (XPS) data of Cd0.99Fe0.01Te0.97Se0.03 and Zn0.98Fe0.02Te0.91Se0.09 crystalline samples. Special attention is paid to the precise identification of phases which form the bulk-like near-surface region and the surface overlayers (the oxide layer and the layer of organic impurities), as well as the influence of surface morphology on the measurements. The obtained results fully support earlier qualitative estimations, but also provide new quantitative insight into the composition of the three investigated regions. The near-surface region of Cd0.99Fe0.01Te0.97Se0.03 and Zn0.98Fe0.02Te0.91Se0.09 samples is slightly electropositive, with cation/anion ratio 52:48 and 53:47, respectively. Model surface structures, which are fully compatible with the experimental results, comprise 0.76 nm thick CdTeO3 layer at the surface of Cd0.99Fe0.01Te0.97Se0.03 and 0.33 nm thick mixed ZnO/TeO2 oxide layer on Zn0.98Fe0.02Te0.91Se0.09. In both samples the oxide layer is only a few atomic layers thick, implying that it suppresses further rapid migration of oxygen into the bulk.
T2  - Vacuum
T1  - XPS measurements of air-exposed Cd(Zn)1xFexTe1ySey surfaces revisited
VL  - 176
SP  - 109340
DO  - 10.1016/j.vacuum.2020.109340
ER  - 

@article{
author = "Medić-Ilić, Mirjana and Bundaleski, Nenad and Ivanović, Nenad and Teodoro, Orlando M. N. D. and Rakočević, Zlatko Lj. and Minić, Dragica M. and Romčević, Nebojša Ž. and Radisavljević, Ivana",
year = "2020",
abstract = "Recently introduced model for quantitative analysis of in-depth non-uniform surfaces is applied to reexamine the X-ray Photoelectron Spectroscopy (XPS) data of Cd0.99Fe0.01Te0.97Se0.03 and Zn0.98Fe0.02Te0.91Se0.09 crystalline samples. Special attention is paid to the precise identification of phases which form the bulk-like near-surface region and the surface overlayers (the oxide layer and the layer of organic impurities), as well as the influence of surface morphology on the measurements. The obtained results fully support earlier qualitative estimations, but also provide new quantitative insight into the composition of the three investigated regions. The near-surface region of Cd0.99Fe0.01Te0.97Se0.03 and Zn0.98Fe0.02Te0.91Se0.09 samples is slightly electropositive, with cation/anion ratio 52:48 and 53:47, respectively. Model surface structures, which are fully compatible with the experimental results, comprise 0.76 nm thick CdTeO3 layer at the surface of Cd0.99Fe0.01Te0.97Se0.03 and 0.33 nm thick mixed ZnO/TeO2 oxide layer on Zn0.98Fe0.02Te0.91Se0.09. In both samples the oxide layer is only a few atomic layers thick, implying that it suppresses further rapid migration of oxygen into the bulk.",
journal = "Vacuum",
title = "XPS measurements of air-exposed Cd(Zn)1xFexTe1ySey surfaces revisited",
volume = "176",
pages = "109340",
doi = "10.1016/j.vacuum.2020.109340"
}

Medić-Ilić, M., Bundaleski, N., Ivanović, N., Teodoro, O. M. N. D., Rakočević, Z. Lj., Minić, D. M., Romčević, N. Ž.,& Radisavljević, I.. (2020). XPS measurements of air-exposed Cd(Zn)1xFexTe1ySey surfaces revisited. in Vacuum, 176, 109340.
https://doi.org/10.1016/j.vacuum.2020.109340

Medić-Ilić M, Bundaleski N, Ivanović N, Teodoro OMND, Rakočević ZL, Minić DM, Romčević NŽ, Radisavljević I. XPS measurements of air-exposed Cd(Zn)1xFexTe1ySey surfaces revisited. in Vacuum. 2020;176:109340.
doi:10.1016/j.vacuum.2020.109340 .

Medić-Ilić, Mirjana, Bundaleski, Nenad, Ivanović, Nenad, Teodoro, Orlando M. N. D., Rakočević, Zlatko Lj., Minić, Dragica M., Romčević, Nebojša Ž., Radisavljević, Ivana, "XPS measurements of air-exposed Cd(Zn)1xFexTe1ySey surfaces revisited" in Vacuum, 176 (2020):109340,
https://doi.org/10.1016/j.vacuum.2020.109340 . .