TY  - CONF
AU  - Duane, Russell
AU  - Vasović, Nikola
AU  - White, Mary
AU  - Blake, Alan
AU  - Marie McGarrigle, Anne
AU  - Stanković, Srboljub
AU  - Jakšić, Aleksandar
PY  - 2022
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/11116
AB  - A Metal Oxide Semiconductor (MOS) ionizing radiation detector architecture which senses trapped charge in the dielectric due to incident ionizing radiation is presented. The detector architecture increases output voltage signal as a function of trapped charge in the sensing dielectric in comparison with state of the art MOSFET (RADFET) technology. Numerical simulations were employed to help develop the device concept. It is shown that an improved voltage sensitivity is possible due to a reduction in the sensing capacitance which, unlike RADFET technology, is decoupled from the dielectric capacitance. An initial prototype of the detector has been fabricated in the silicon fabrication facility of Tyndall National Institute and irradiation experiments have been performed which confirm the improved voltage sensitivity versus commercial RADFET detectors. It is envisaged that further sensitivity increases may be possible by integrating dielectrics other than silicon dioxide.
PB  - RAD Centre, Niš, Serbia
C3  - RAD 2022 : 10th Jubilee International Conference on Radiation in Various Fields of Research : book of abstracts; June 13-17; Herceg Novi, Montenegro
T1  - A Metal Oxide Semiconductor ionizing radiation detector architecture with increased voltage sensitivity
SP  - 109
DO  - 10.21175/rad.spr.abstr.book.2022.26.8
ER  - 

@conference{
author = "Duane, Russell and Vasović, Nikola and White, Mary and Blake, Alan and Marie McGarrigle, Anne and Stanković, Srboljub and Jakšić, Aleksandar",
year = "2022",
abstract = "A Metal Oxide Semiconductor (MOS) ionizing radiation detector architecture which senses trapped charge in the dielectric due to incident ionizing radiation is presented. The detector architecture increases output voltage signal as a function of trapped charge in the sensing dielectric in comparison with state of the art MOSFET (RADFET) technology. Numerical simulations were employed to help develop the device concept. It is shown that an improved voltage sensitivity is possible due to a reduction in the sensing capacitance which, unlike RADFET technology, is decoupled from the dielectric capacitance. An initial prototype of the detector has been fabricated in the silicon fabrication facility of Tyndall National Institute and irradiation experiments have been performed which confirm the improved voltage sensitivity versus commercial RADFET detectors. It is envisaged that further sensitivity increases may be possible by integrating dielectrics other than silicon dioxide.",
publisher = "RAD Centre, Niš, Serbia",
journal = "RAD 2022 : 10th Jubilee International Conference on Radiation in Various Fields of Research : book of abstracts; June 13-17; Herceg Novi, Montenegro",
title = "A Metal Oxide Semiconductor ionizing radiation detector architecture with increased voltage sensitivity",
pages = "109",
doi = "10.21175/rad.spr.abstr.book.2022.26.8"
}

Duane, R., Vasović, N., White, M., Blake, A., Marie McGarrigle, A., Stanković, S.,& Jakšić, A.. (2022). A Metal Oxide Semiconductor ionizing radiation detector architecture with increased voltage sensitivity. in RAD 2022 : 10th Jubilee International Conference on Radiation in Various Fields of Research : book of abstracts; June 13-17; Herceg Novi, Montenegro
RAD Centre, Niš, Serbia., 109.
https://doi.org/10.21175/rad.spr.abstr.book.2022.26.8

Duane R, Vasović N, White M, Blake A, Marie McGarrigle A, Stanković S, Jakšić A. A Metal Oxide Semiconductor ionizing radiation detector architecture with increased voltage sensitivity. in RAD 2022 : 10th Jubilee International Conference on Radiation in Various Fields of Research : book of abstracts; June 13-17; Herceg Novi, Montenegro. 2022;:109.
doi:10.21175/rad.spr.abstr.book.2022.26.8 .

Duane, Russell, Vasović, Nikola, White, Mary, Blake, Alan, Marie McGarrigle, Anne, Stanković, Srboljub, Jakšić, Aleksandar, "A Metal Oxide Semiconductor ionizing radiation detector architecture with increased voltage sensitivity" in RAD 2022 : 10th Jubilee International Conference on Radiation in Various Fields of Research : book of abstracts; June 13-17; Herceg Novi, Montenegro (2022):109,
https://doi.org/10.21175/rad.spr.abstr.book.2022.26.8 . .