TY  - JOUR
AU  - Zec, Slavica
AU  - Bošković, Snežana B.
AU  - Kaluđerović, Branka V.
AU  - Bogdanov, Žarko
AU  - Popovic, Nada
PY  - 2009
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/3592
AB  - The reduction of commercial and mechanochemically processed CeO2 powders was studied. Nanostructured CeO2, with the crystallite size of 21 nm and the lattice distortion of 0.37%, was obtained during 60 min of milling in a high-energetic vibratory mill. X-ray diffraction, scanning electron microscopy and Brunauer-Emmett-Teller method were applied to characterize the milled powders. During the thermal treatment at 1200 and 1400 degrees C in an argon atmosphere the nonstoichiometric CeO2-x oxides with the defect fluorite structure were formed. Compositions of CeO2-x oxides were determined according to its lattice parameter. The results showed that the release of oxygen, as well as the rate of reduction, was more effective in nanocrystalline then in the microcrystalline CeO2, producing at 1200 degrees C Ce-1.80 and CeO1.85 oxides, while at 1400 degrees C were obtained similarly, CeO1.77 and CeO1.78, compositions. (c) 2007 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
T2  - Ceramics International
T1  - Chemical reduction of nanocrystalline CeO2
VL  - 35
IS  - 1
SP  - 195
EP  - 198
DO  - 10.1016/j.ceramint.2007.10.031
ER  - 

@article{
author = "Zec, Slavica and Bošković, Snežana B. and Kaluđerović, Branka V. and Bogdanov, Žarko and Popovic, Nada",
year = "2009",
abstract = "The reduction of commercial and mechanochemically processed CeO2 powders was studied. Nanostructured CeO2, with the crystallite size of 21 nm and the lattice distortion of 0.37%, was obtained during 60 min of milling in a high-energetic vibratory mill. X-ray diffraction, scanning electron microscopy and Brunauer-Emmett-Teller method were applied to characterize the milled powders. During the thermal treatment at 1200 and 1400 degrees C in an argon atmosphere the nonstoichiometric CeO2-x oxides with the defect fluorite structure were formed. Compositions of CeO2-x oxides were determined according to its lattice parameter. The results showed that the release of oxygen, as well as the rate of reduction, was more effective in nanocrystalline then in the microcrystalline CeO2, producing at 1200 degrees C Ce-1.80 and CeO1.85 oxides, while at 1400 degrees C were obtained similarly, CeO1.77 and CeO1.78, compositions. (c) 2007 Elsevier Ltd and Techna Group S.r.l. All rights reserved.",
journal = "Ceramics International",
title = "Chemical reduction of nanocrystalline CeO2",
volume = "35",
number = "1",
pages = "195-198",
doi = "10.1016/j.ceramint.2007.10.031"
}

Zec, S., Bošković, S. B., Kaluđerović, B. V., Bogdanov, Ž.,& Popovic, N.. (2009). Chemical reduction of nanocrystalline CeO2. in Ceramics International, 35(1), 195-198.
https://doi.org/10.1016/j.ceramint.2007.10.031

Zec S, Bošković SB, Kaluđerović BV, Bogdanov Ž, Popovic N. Chemical reduction of nanocrystalline CeO2. in Ceramics International. 2009;35(1):195-198.
doi:10.1016/j.ceramint.2007.10.031 .

Zec, Slavica, Bošković, Snežana B., Kaluđerović, Branka V., Bogdanov, Žarko, Popovic, Nada, "Chemical reduction of nanocrystalline CeO2" in Ceramics International, 35, no. 1 (2009):195-198,
https://doi.org/10.1016/j.ceramint.2007.10.031 . .

TY  - JOUR
AU  - Petrović, Suzana
AU  - Adnađević, Borivoj
AU  - Peruško, Davor
AU  - Popovic, Nada
AU  - Bundaleski, Nenad
AU  - Radović, Milan
AU  - Gaković, Biljana M.
AU  - Rakočević, Zlatko Lj.
PY  - 2006
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/3123
AB  - Thin films were deposited by d.c. sputtering onto a Silicon Substrate. The influence of the W-Ti thin film thickness to its structural and morphological characteristics of a nano-scale were studied. The phase composition and grain size were studied by X-ray diffraction (XRD), while the surface morphology and surface roughness were determined by scanning tunneling microscopy (STM). The analysis of the phase composition show that the thin films had a polycrystalline structure they were composed of a b.c.c. W phase with the presence of a h.c.p. Ti phase. The XRD peak in the scattering angle interval of 38 degrees-43 degrees was interpreted as an overlap of peaks corresponding to the W(110) and Ti(101) planes. The grain size and the mean surface roughness both increase with the thikness of the thin film. The chemical composition of the thin film surface was also analysed by low energy ions scattering (LEIS). The results show the surface segregation of titanium, as well as a substantial presence of oxygen an the surface.
T2  - Journal of the Serbian Chemical Society
T1  - Structure and morphology of nano-sized W-Ti/Si thin films
VL  - 71
IS  - 8-9
SP  - 969
EP  - 976
DO  - 10.2298/JSC0609969P
ER  - 

@article{
author = "Petrović, Suzana and Adnađević, Borivoj and Peruško, Davor and Popovic, Nada and Bundaleski, Nenad and Radović, Milan and Gaković, Biljana M. and Rakočević, Zlatko Lj.",
year = "2006",
abstract = "Thin films were deposited by d.c. sputtering onto a Silicon Substrate. The influence of the W-Ti thin film thickness to its structural and morphological characteristics of a nano-scale were studied. The phase composition and grain size were studied by X-ray diffraction (XRD), while the surface morphology and surface roughness were determined by scanning tunneling microscopy (STM). The analysis of the phase composition show that the thin films had a polycrystalline structure they were composed of a b.c.c. W phase with the presence of a h.c.p. Ti phase. The XRD peak in the scattering angle interval of 38 degrees-43 degrees was interpreted as an overlap of peaks corresponding to the W(110) and Ti(101) planes. The grain size and the mean surface roughness both increase with the thikness of the thin film. The chemical composition of the thin film surface was also analysed by low energy ions scattering (LEIS). The results show the surface segregation of titanium, as well as a substantial presence of oxygen an the surface.",
journal = "Journal of the Serbian Chemical Society",
title = "Structure and morphology of nano-sized W-Ti/Si thin films",
volume = "71",
number = "8-9",
pages = "969-976",
doi = "10.2298/JSC0609969P"
}

Petrović, S., Adnađević, B., Peruško, D., Popovic, N., Bundaleski, N., Radović, M., Gaković, B. M.,& Rakočević, Z. Lj.. (2006). Structure and morphology of nano-sized W-Ti/Si thin films. in Journal of the Serbian Chemical Society, 71(8-9), 969-976.
https://doi.org/10.2298/JSC0609969P

Petrović S, Adnađević B, Peruško D, Popovic N, Bundaleski N, Radović M, Gaković BM, Rakočević ZL. Structure and morphology of nano-sized W-Ti/Si thin films. in Journal of the Serbian Chemical Society. 2006;71(8-9):969-976.
doi:10.2298/JSC0609969P .

Petrović, Suzana, Adnađević, Borivoj, Peruško, Davor, Popovic, Nada, Bundaleski, Nenad, Radović, Milan, Gaković, Biljana M., Rakočević, Zlatko Lj., "Structure and morphology of nano-sized W-Ti/Si thin films" in Journal of the Serbian Chemical Society, 71, no. 8-9 (2006):969-976,
https://doi.org/10.2298/JSC0609969P . .