TY  - CONF
AU  - Bordas, A.
AU  - Vučinić-Vasić, M.
AU  - Antić, Bratislav
AU  - Kremenović, A.
AU  - Nikolić, A. S.
AU  - Kapor, Agneš
PY  - 2004
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/12898
AB  - The short-range order (nearest and higher neighbor distances) and the cell constants have been experimentally estimated for nanosized spinel Zn- and Mn-ferrites using pair distribution function anlysis. The results were compared with the theoretical values and Rietveld refinement values of XRPD data.
C3  - SFKM 2004 : XVI National Symposium on Condensed Matter Physics : Program and Contributed Papers
T1  - Structural Study of Nanosized ZnFe2O4 and MnFe2O4 Using Atomic Pair Distribution Function
SP  - 18
EP  - 21
UR  - https://hdl.handle.net/21.15107/rcub_vinar_12898
ER  - 

@conference{
author = "Bordas, A. and Vučinić-Vasić, M. and Antić, Bratislav and Kremenović, A. and Nikolić, A. S. and Kapor, Agneš",
year = "2004",
abstract = "The short-range order (nearest and higher neighbor distances) and the cell constants have been experimentally estimated for nanosized spinel Zn- and Mn-ferrites using pair distribution function anlysis. The results were compared with the theoretical values and Rietveld refinement values of XRPD data.",
journal = "SFKM 2004 : XVI National Symposium on Condensed Matter Physics : Program and Contributed Papers",
title = "Structural Study of Nanosized ZnFe2O4 and MnFe2O4 Using Atomic Pair Distribution Function",
pages = "18-21",
url = "https://hdl.handle.net/21.15107/rcub_vinar_12898"
}

Bordas, A., Vučinić-Vasić, M., Antić, B., Kremenović, A., Nikolić, A. S.,& Kapor, A.. (2004). Structural Study of Nanosized ZnFe2O4 and MnFe2O4 Using Atomic Pair Distribution Function. in SFKM 2004 : XVI National Symposium on Condensed Matter Physics : Program and Contributed Papers, 18-21.
https://hdl.handle.net/21.15107/rcub_vinar_12898

Bordas A, Vučinić-Vasić M, Antić B, Kremenović A, Nikolić AS, Kapor A. Structural Study of Nanosized ZnFe2O4 and MnFe2O4 Using Atomic Pair Distribution Function. in SFKM 2004 : XVI National Symposium on Condensed Matter Physics : Program and Contributed Papers. 2004;:18-21.
https://hdl.handle.net/21.15107/rcub_vinar_12898 .

Bordas, A., Vučinić-Vasić, M., Antić, Bratislav, Kremenović, A., Nikolić, A. S., Kapor, Agneš, "Structural Study of Nanosized ZnFe2O4 and MnFe2O4 Using Atomic Pair Distribution Function" in SFKM 2004 : XVI National Symposium on Condensed Matter Physics : Program and Contributed Papers (2004):18-21,
https://hdl.handle.net/21.15107/rcub_vinar_12898 .

TY  - JOUR
AU  - Bordas, A
AU  - Vučinić-Vasić, Milica
AU  - Kapor, Agneš
AU  - Antić, Bratislav
PY  - 2001
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/6324
AB  - Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu-25 [AsSe1.4I0.2](75) amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units.
T2  - Materials Science Forum
T1  - X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor
VL  - 378-3
SP  - 394
EP  - 399
DO  - 10.4028/www.scientific.net/MSF.378-381.394
ER  - 

@article{
author = "Bordas, A and Vučinić-Vasić, Milica and Kapor, Agneš and Antić, Bratislav",
year = "2001",
abstract = "Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu-25 [AsSe1.4I0.2](75) amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units.",
journal = "Materials Science Forum",
title = "X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor",
volume = "378-3",
pages = "394-399",
doi = "10.4028/www.scientific.net/MSF.378-381.394"
}

Bordas, A., Vučinić-Vasić, M., Kapor, A.,& Antić, B.. (2001). X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor. in Materials Science Forum, 378-3, 394-399.
https://doi.org/10.4028/www.scientific.net/MSF.378-381.394

Bordas A, Vučinić-Vasić M, Kapor A, Antić B. X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor. in Materials Science Forum. 2001;378-3:394-399.
doi:10.4028/www.scientific.net/MSF.378-381.394 .

Bordas, A, Vučinić-Vasić, Milica, Kapor, Agneš, Antić, Bratislav, "X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor" in Materials Science Forum, 378-3 (2001):394-399,
https://doi.org/10.4028/www.scientific.net/MSF.378-381.394 . .