Krousky, Edouard

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  • Krousky, Edouard (1)
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Author's Bibliography

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Bussoli, Marco; Batani, Dimitri; Desai, Tara; Canova, Federico; Milani, Marziale; Trtica, Milan; Gaković, Biljana M.; Krousky, Edouard

(2007)

TY  - JOUR
AU  - Bussoli, Marco
AU  - Batani, Dimitri
AU  - Desai, Tara
AU  - Canova, Federico
AU  - Milani, Marziale
AU  - Trtica, Milan
AU  - Gaković, Biljana M.
AU  - Krousky, Edouard
PY  - 2007
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/3173
AB  - We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.
T2  - Laser and Particle Beams
T1  - Study of laser induced ablation with focused ion beam/scanning electron microscope devices
VL  - 25
IS  - 1
SP  - 121
EP  - 125
DO  - 10.1017/S0263034607070139
ER  - 
@article{
author = "Bussoli, Marco and Batani, Dimitri and Desai, Tara and Canova, Federico and Milani, Marziale and Trtica, Milan and Gaković, Biljana M. and Krousky, Edouard",
year = "2007",
abstract = "We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.",
journal = "Laser and Particle Beams",
title = "Study of laser induced ablation with focused ion beam/scanning electron microscope devices",
volume = "25",
number = "1",
pages = "121-125",
doi = "10.1017/S0263034607070139"
}
Bussoli, M., Batani, D., Desai, T., Canova, F., Milani, M., Trtica, M., Gaković, B. M.,& Krousky, E.. (2007). Study of laser induced ablation with focused ion beam/scanning electron microscope devices. in Laser and Particle Beams, 25(1), 121-125.
https://doi.org/10.1017/S0263034607070139
Bussoli M, Batani D, Desai T, Canova F, Milani M, Trtica M, Gaković BM, Krousky E. Study of laser induced ablation with focused ion beam/scanning electron microscope devices. in Laser and Particle Beams. 2007;25(1):121-125.
doi:10.1017/S0263034607070139 .
Bussoli, Marco, Batani, Dimitri, Desai, Tara, Canova, Federico, Milani, Marziale, Trtica, Milan, Gaković, Biljana M., Krousky, Edouard, "Study of laser induced ablation with focused ion beam/scanning electron microscope devices" in Laser and Particle Beams, 25, no. 1 (2007):121-125,
https://doi.org/10.1017/S0263034607070139 . .
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