TY  - CONF
AU  - Kovacevic, Uros
AU  - Bajramovic, Zijad
AU  - Jovanović, Bojan
AU  - Lazarević, Đorđe R.
AU  - Djekic, Sasa
PY  - 2015
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/7104
AB  - The problem of pulse voltage measurements in the nanoseconds range has become of great importance with ongoing problems related to the construction of pulse fusion generators as well as with simulations of electromagnetic pulses related to the atmospheric nuclear explosion. Ultrafast pulses in the nanoseconds range can be measured by the capacitive voltage divider. The problem that arises with ultrafast voltage occurrence is inductivity. Under conditions of the nanoseconds pulse increase rate, conductors of about few centimeters should be regarded as inductivity. Therefore, capacitive divider can be treated as an equivalent RLC circuit. The ohmic resistance R in that equivalent circuit originates from the characteristic impedance (either 50 Omega or 75 Omega) and, depending on its design, it can introduce an additional parasite inductivity. The aim of this paper is to consider and analyze the constructive solutions of capacitive voltage divider for measuring ultrafast voltage occurrence. Three types of capacitive divider will be constructed for that purpose. The high-voltage capacitor of each divider will be gas capacitor (in order to avoid both electrostatic and electrodynamic influence on measurement accuracy). The variations between divider types will be made for low-voltage capacitor. The designed low-voltage capacitors will be: 1 - in the shape of 10 mica capacitors connected in a parallel with a discrete ending resistor of 50 Omega; 2 - in the form of gas trimmer capacitor with a discrete ending resistor of 50 Omega, and 3 - the continual mica capacitor with waveguide resistor of 50 Omega (L=0). Ultrafast pulse response will be measured with dividers constructed in such manner, and will be compared with the corresponding response obtained from the numerical simulations.
T1  - The Construction of Capacitive Voltage Divider for Measuring Ultrafast Pulse Voltage
UR  - https://hdl.handle.net/21.15107/rcub_vinar_7104
ER  - 

@conference{
author = "Kovacevic, Uros and Bajramovic, Zijad and Jovanović, Bojan and Lazarević, Đorđe R. and Djekic, Sasa",
year = "2015",
abstract = "The problem of pulse voltage measurements in the nanoseconds range has become of great importance with ongoing problems related to the construction of pulse fusion generators as well as with simulations of electromagnetic pulses related to the atmospheric nuclear explosion. Ultrafast pulses in the nanoseconds range can be measured by the capacitive voltage divider. The problem that arises with ultrafast voltage occurrence is inductivity. Under conditions of the nanoseconds pulse increase rate, conductors of about few centimeters should be regarded as inductivity. Therefore, capacitive divider can be treated as an equivalent RLC circuit. The ohmic resistance R in that equivalent circuit originates from the characteristic impedance (either 50 Omega or 75 Omega) and, depending on its design, it can introduce an additional parasite inductivity. The aim of this paper is to consider and analyze the constructive solutions of capacitive voltage divider for measuring ultrafast voltage occurrence. Three types of capacitive divider will be constructed for that purpose. The high-voltage capacitor of each divider will be gas capacitor (in order to avoid both electrostatic and electrodynamic influence on measurement accuracy). The variations between divider types will be made for low-voltage capacitor. The designed low-voltage capacitors will be: 1 - in the shape of 10 mica capacitors connected in a parallel with a discrete ending resistor of 50 Omega; 2 - in the form of gas trimmer capacitor with a discrete ending resistor of 50 Omega, and 3 - the continual mica capacitor with waveguide resistor of 50 Omega (L=0). Ultrafast pulse response will be measured with dividers constructed in such manner, and will be compared with the corresponding response obtained from the numerical simulations.",
title = "The Construction of Capacitive Voltage Divider for Measuring Ultrafast Pulse Voltage",
url = "https://hdl.handle.net/21.15107/rcub_vinar_7104"
}

Kovacevic, U., Bajramovic, Z., Jovanović, B., Lazarević, Đ. R.,& Djekic, S.. (2015). The Construction of Capacitive Voltage Divider for Measuring Ultrafast Pulse Voltage. .
https://hdl.handle.net/21.15107/rcub_vinar_7104

Kovacevic U, Bajramovic Z, Jovanović B, Lazarević ĐR, Djekic S. The Construction of Capacitive Voltage Divider for Measuring Ultrafast Pulse Voltage. 2015;.
https://hdl.handle.net/21.15107/rcub_vinar_7104 .

Kovacevic, Uros, Bajramovic, Zijad, Jovanović, Bojan, Lazarević, Đorđe R., Djekic, Sasa, "The Construction of Capacitive Voltage Divider for Measuring Ultrafast Pulse Voltage" (2015),
https://hdl.handle.net/21.15107/rcub_vinar_7104 .

TY  - CONF
AU  - Lončar, Boris B.
AU  - Stanković, Srboljub
AU  - Stanković, Koviljka
AU  - Jovanović, Bojan
PY  - 2010
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/6963
AB  - This paper compares the reliability of standard commercial Erasable Programmable Read Only Memory (EPROM) and Electrically Erasable Programmable Read Only Memory ((EPROM)-P-2) components exposed to gamma rays. Results obtained for CMOS-based EPROM (NM27C010) and (EPROM)-P-2 (NM93CS46) components provide evidence that EPROMs have a greater radiation hardness than (EPROMs)-P-2. Moreover, the changes in EPROMs are reversible, and after erasure and reprogramming all EPROM components restore their functionality. On the other hand, changes in (EPROMs)-P-2 are irreversible. The obtained results are analyzed and interpreted on the basis of gamma ray interaction with the CMOS structure.
C3  - PIERS 2010 : Progress in Electromagnetics Research Symposium : Proceedings
T1  - Influence of Gamma Radiation on Some Commercial EPROM and EEPROM Components
SP  - 1193
EP  - 1198
UR  - https://hdl.handle.net/21.15107/rcub_vinar_6963
ER  - 

@conference{
author = "Lončar, Boris B. and Stanković, Srboljub and Stanković, Koviljka and Jovanović, Bojan",
year = "2010",
abstract = "This paper compares the reliability of standard commercial Erasable Programmable Read Only Memory (EPROM) and Electrically Erasable Programmable Read Only Memory ((EPROM)-P-2) components exposed to gamma rays. Results obtained for CMOS-based EPROM (NM27C010) and (EPROM)-P-2 (NM93CS46) components provide evidence that EPROMs have a greater radiation hardness than (EPROMs)-P-2. Moreover, the changes in EPROMs are reversible, and after erasure and reprogramming all EPROM components restore their functionality. On the other hand, changes in (EPROMs)-P-2 are irreversible. The obtained results are analyzed and interpreted on the basis of gamma ray interaction with the CMOS structure.",
journal = "PIERS 2010 : Progress in Electromagnetics Research Symposium : Proceedings",
title = "Influence of Gamma Radiation on Some Commercial EPROM and EEPROM Components",
pages = "1193-1198",
url = "https://hdl.handle.net/21.15107/rcub_vinar_6963"
}

Lončar, B. B., Stanković, S., Stanković, K.,& Jovanović, B.. (2010). Influence of Gamma Radiation on Some Commercial EPROM and EEPROM Components. in PIERS 2010 : Progress in Electromagnetics Research Symposium : Proceedings, 1193-1198.
https://hdl.handle.net/21.15107/rcub_vinar_6963

Lončar BB, Stanković S, Stanković K, Jovanović B. Influence of Gamma Radiation on Some Commercial EPROM and EEPROM Components. in PIERS 2010 : Progress in Electromagnetics Research Symposium : Proceedings. 2010;:1193-1198.
https://hdl.handle.net/21.15107/rcub_vinar_6963 .

Lončar, Boris B., Stanković, Srboljub, Stanković, Koviljka, Jovanović, Bojan, "Influence of Gamma Radiation on Some Commercial EPROM and EEPROM Components" in PIERS 2010 : Progress in Electromagnetics Research Symposium : Proceedings (2010):1193-1198,
https://hdl.handle.net/21.15107/rcub_vinar_6963 .