TY  - JOUR
AU  - Antić, Željka
AU  - Prashanthi, Kovur
AU  - Kuzman, Sanja
AU  - Periša, Jovana
AU  - Ristić, Zoran
AU  - Palkar, Vaijayanti R.
AU  - Dramićanin, Miroslav
PY  - 2020
UR  - https://vinar.vin.bg.ac.rs/handle/123456789/8998
AB  - A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO3semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO3nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (Sa) and the relative sensor sensitivity (Sr) and the temperature resolution (?Tm) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K-1and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors.
T2  - RSC Advances
T1  - Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles
VL  - 10
IS  - 29
SP  - 16982
EP  - 16986
DO  - 10.1039/D0RA01896A
ER  - 

@article{
author = "Antić, Željka and Prashanthi, Kovur and Kuzman, Sanja and Periša, Jovana and Ristić, Zoran and Palkar, Vaijayanti R. and Dramićanin, Miroslav",
year = "2020",
abstract = "A strategy for optical nanothermometry using the negative thermal quenching behavior of intrinsic BiFeO3semiconductor nanoparticles has been reported here. X-ray diffraction measurement shows polycrystalline BiFeO3nanoparticles with a rhombohedral distorted perovskite structure. Transmission electron microscopy shows agglomerated crystalline nanoparticles around 20 nm in size. Photoluminescence measurements show that intensity of the defect level emission increases significantly with temperature, while the intensity of near band emission and other defect levels emissions show an opposite trend. The most important figures of merit for luminescence nanothermometry: the absolute (Sa) and the relative sensor sensitivity (Sr) and the temperature resolution (?Tm) were effectively resolved and calculated. The relative sensitivity and temperature resolution values are found to be 2.5% K-1and 0.2 K, respectively which are among the highest reported values observed so far for semiconductors.",
journal = "RSC Advances",
title = "Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles",
volume = "10",
number = "29",
pages = "16982-16986",
doi = "10.1039/D0RA01896A"
}

Antić, Ž., Prashanthi, K., Kuzman, S., Periša, J., Ristić, Z., Palkar, V. R.,& Dramićanin, M.. (2020). Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles. in RSC Advances, 10(29), 16982-16986.
https://doi.org/10.1039/D0RA01896A

Antić Ž, Prashanthi K, Kuzman S, Periša J, Ristić Z, Palkar VR, Dramićanin M. Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles. in RSC Advances. 2020;10(29):16982-16986.
doi:10.1039/D0RA01896A .

Antić, Željka, Prashanthi, Kovur, Kuzman, Sanja, Periša, Jovana, Ristić, Zoran, Palkar, Vaijayanti R., Dramićanin, Miroslav, "Ratiometric temperature measurement using negative thermal quenching of intrinsic BiFeO3 semiconductor nanoparticles" in RSC Advances, 10, no. 29 (2020):16982-16986,
https://doi.org/10.1039/D0RA01896A . .