Преглед 010 - Laboratorija za fiziku аутора: "Androulakaki, Effrossyni G."
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Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy
Kokkoris, Michael; Androulakaki, Effrossyni G.; Czyzycki, Mateusz; Erich, Marko; Karydas, Andreas G.; Leani, Juan J.; Migliori, Alessandro; Ntemou, Eleni; Paneta, Valentina; Petrović, Srđan M. (Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2019)