Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy
Samo za registrovane korisnike
2018
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© Copyright 2018 Elsevier B.V.
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Prikaz svih podataka o dokumentuApstrakt
The effect of incorporating copper (Cu) and selenium (Se) ions into stibnite (Sb2S3) lattice was investigated using x-ray photoelectron spectroscopy (XPS). The incorporation of Cu and Se ions was verified by comparing the XPS spectra of the undoped (amorphous Sb2S3), doped (p and n-doped) and pure Se and Cu-acetate powders. The main photoelectron Cu 2p(1/2) (951.8 eV) and Cu 2p(3/2) (932.1 eV) lines derived from the Cu-doped and Cu-acetate powder samples were clearly observed, whereas in the undoped sample, none of the characteristic lines of Cu were detected. The Se Auger line (138.6 eV), the only line of Se which does not coincide with the lines of Sb and S, was successfully detected in an Se-doped XPS sample and the spectrum of pure Se, while Se in the undoped sample was not found. Further, the XPS measurements revealed the relative amounts of Cu and Se in antimony sulfide, as well as the oxidation state of copper incorporated into the matrix.
Ključne reči:
Sb2S3 / semiconductor / X-ray photoelectron spectros / solar energy materialIzvor:
Journal of Electronic Materials, 2018, 47, 4, 2402-2410Finansiranje / projekti:
- Funkcionalni, funkcionalizovani i usavršeni nano materijali (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45005)
DOI: 10.1007/s11664-018-6072-5
ISSN: 0361-5235; 1543-186X
WoS: 000426586000028
Scopus: 2-s2.0-85040988704
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Institucija/grupa
VinčaTY - JOUR AU - Validžić, Ivana Lj. AU - Popović, Maja AU - Lojpur, Vesna AU - Bundaleski, Nenad AU - Rakočević, Zlatko Lj. PY - 2018 UR - https://vinar.vin.bg.ac.rs/handle/123456789/7646 AB - The effect of incorporating copper (Cu) and selenium (Se) ions into stibnite (Sb2S3) lattice was investigated using x-ray photoelectron spectroscopy (XPS). The incorporation of Cu and Se ions was verified by comparing the XPS spectra of the undoped (amorphous Sb2S3), doped (p and n-doped) and pure Se and Cu-acetate powders. The main photoelectron Cu 2p(1/2) (951.8 eV) and Cu 2p(3/2) (932.1 eV) lines derived from the Cu-doped and Cu-acetate powder samples were clearly observed, whereas in the undoped sample, none of the characteristic lines of Cu were detected. The Se Auger line (138.6 eV), the only line of Se which does not coincide with the lines of Sb and S, was successfully detected in an Se-doped XPS sample and the spectrum of pure Se, while Se in the undoped sample was not found. Further, the XPS measurements revealed the relative amounts of Cu and Se in antimony sulfide, as well as the oxidation state of copper incorporated into the matrix. T2 - Journal of Electronic Materials T1 - Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy VL - 47 IS - 4 SP - 2402 EP - 2410 DO - 10.1007/s11664-018-6072-5 ER -
@article{ author = "Validžić, Ivana Lj. and Popović, Maja and Lojpur, Vesna and Bundaleski, Nenad and Rakočević, Zlatko Lj.", year = "2018", abstract = "The effect of incorporating copper (Cu) and selenium (Se) ions into stibnite (Sb2S3) lattice was investigated using x-ray photoelectron spectroscopy (XPS). The incorporation of Cu and Se ions was verified by comparing the XPS spectra of the undoped (amorphous Sb2S3), doped (p and n-doped) and pure Se and Cu-acetate powders. The main photoelectron Cu 2p(1/2) (951.8 eV) and Cu 2p(3/2) (932.1 eV) lines derived from the Cu-doped and Cu-acetate powder samples were clearly observed, whereas in the undoped sample, none of the characteristic lines of Cu were detected. The Se Auger line (138.6 eV), the only line of Se which does not coincide with the lines of Sb and S, was successfully detected in an Se-doped XPS sample and the spectrum of pure Se, while Se in the undoped sample was not found. Further, the XPS measurements revealed the relative amounts of Cu and Se in antimony sulfide, as well as the oxidation state of copper incorporated into the matrix.", journal = "Journal of Electronic Materials", title = "Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy", volume = "47", number = "4", pages = "2402-2410", doi = "10.1007/s11664-018-6072-5" }
Validžić, I. Lj., Popović, M., Lojpur, V., Bundaleski, N.,& Rakočević, Z. Lj.. (2018). Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy. in Journal of Electronic Materials, 47(4), 2402-2410. https://doi.org/10.1007/s11664-018-6072-5
Validžić IL, Popović M, Lojpur V, Bundaleski N, Rakočević ZL. Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy. in Journal of Electronic Materials. 2018;47(4):2402-2410. doi:10.1007/s11664-018-6072-5 .
Validžić, Ivana Lj., Popović, Maja, Lojpur, Vesna, Bundaleski, Nenad, Rakočević, Zlatko Lj., "Confirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopy" in Journal of Electronic Materials, 47, no. 4 (2018):2402-2410, https://doi.org/10.1007/s11664-018-6072-5 . .