Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain
Nema prikaza
Autori
Markushev, Dragan D.Rabasović, Mihailo D.
Todorović, D. M.
Galović, Slobodanka
Bialkowski, S. E.
Članak u časopisu (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
Methods for photoacoustic signal measurement, rectification, and analysis for 85 mu m thin Si samples in the 20-20 000 Hz modulation frequency range are presented. Methods for frequency-dependent amplitude and phase signal rectification in the presence of coherent and incoherent noise as well as distortion due to microphone characteristics are presented. Signal correction is accomplished using inverse system response functions deduced by comparing real to ideal signals for a sample with well-known bulk parameters and dimensions. The system response is a piece-wise construction, each component being due to a particular effect of the measurement system. Heat transfer and elastic effects are modeled using standard Rosencweig-Gersho and elastic-bending theories. Thermal diffusion, thermoelastic, and plasmaelastic signal components are calculated and compared to measurements. The differences between theory and experiment are used to detect and correct signal distortion and to determine dete...ctor and sound-card characteristics. Corrected signal analysis is found to faithfully reflect known sample parameters. (C) 2015 AIP Publishing LLC.
Izvor:
Review of Scientific Instruments, 2015, 86, 3Finansiranje / projekti:
- Atomski sudarni procesi i fotoakustička spektrometrija molekula i čvrstih tela (RS-MESTD-Basic Research (BR or ON)-171016)
- Funkcionalni, funkcionalizovani i usavršeni nano materijali (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45005)
DOI: 10.1063/1.4914894
ISSN: 0034-6748; 1089-7623
PubMed: 25832278
WoS: 000352201400075
Scopus: 2-s2.0-84925799276
Kolekcije
Institucija/grupa
VinčaTY - JOUR AU - Markushev, Dragan D. AU - Rabasović, Mihailo D. AU - Todorović, D. M. AU - Galović, Slobodanka AU - Bialkowski, S. E. PY - 2015 UR - https://vinar.vin.bg.ac.rs/handle/123456789/488 AB - Methods for photoacoustic signal measurement, rectification, and analysis for 85 mu m thin Si samples in the 20-20 000 Hz modulation frequency range are presented. Methods for frequency-dependent amplitude and phase signal rectification in the presence of coherent and incoherent noise as well as distortion due to microphone characteristics are presented. Signal correction is accomplished using inverse system response functions deduced by comparing real to ideal signals for a sample with well-known bulk parameters and dimensions. The system response is a piece-wise construction, each component being due to a particular effect of the measurement system. Heat transfer and elastic effects are modeled using standard Rosencweig-Gersho and elastic-bending theories. Thermal diffusion, thermoelastic, and plasmaelastic signal components are calculated and compared to measurements. The differences between theory and experiment are used to detect and correct signal distortion and to determine detector and sound-card characteristics. Corrected signal analysis is found to faithfully reflect known sample parameters. (C) 2015 AIP Publishing LLC. T2 - Review of Scientific Instruments T1 - Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain VL - 86 IS - 3 DO - 10.1063/1.4914894 ER -
@article{ author = "Markushev, Dragan D. and Rabasović, Mihailo D. and Todorović, D. M. and Galović, Slobodanka and Bialkowski, S. E.", year = "2015", abstract = "Methods for photoacoustic signal measurement, rectification, and analysis for 85 mu m thin Si samples in the 20-20 000 Hz modulation frequency range are presented. Methods for frequency-dependent amplitude and phase signal rectification in the presence of coherent and incoherent noise as well as distortion due to microphone characteristics are presented. Signal correction is accomplished using inverse system response functions deduced by comparing real to ideal signals for a sample with well-known bulk parameters and dimensions. The system response is a piece-wise construction, each component being due to a particular effect of the measurement system. Heat transfer and elastic effects are modeled using standard Rosencweig-Gersho and elastic-bending theories. Thermal diffusion, thermoelastic, and plasmaelastic signal components are calculated and compared to measurements. The differences between theory and experiment are used to detect and correct signal distortion and to determine detector and sound-card characteristics. Corrected signal analysis is found to faithfully reflect known sample parameters. (C) 2015 AIP Publishing LLC.", journal = "Review of Scientific Instruments", title = "Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain", volume = "86", number = "3", doi = "10.1063/1.4914894" }
Markushev, D. D., Rabasović, M. D., Todorović, D. M., Galović, S.,& Bialkowski, S. E.. (2015). Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain. in Review of Scientific Instruments, 86(3). https://doi.org/10.1063/1.4914894
Markushev DD, Rabasović MD, Todorović DM, Galović S, Bialkowski SE. Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain. in Review of Scientific Instruments. 2015;86(3). doi:10.1063/1.4914894 .
Markushev, Dragan D., Rabasović, Mihailo D., Todorović, D. M., Galović, Slobodanka, Bialkowski, S. E., "Photoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domain" in Review of Scientific Instruments, 86, no. 3 (2015), https://doi.org/10.1063/1.4914894 . .