Composition and structure modification of a WTi/Si system by short laser pulses
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Petrović, SuzanaGaković, Biljana M.
Peruško, Davor
Radak, Bojan
Desai, T.
Kovač, Janez
Panjan, Peter
Trtica, Milan
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Picosecond (40 ps) pulsed Nd:YAG laser irradiation of a WTi thin film on silicon with a wavelength of 532 nm and a fluence 2.1 J/cm(2) was performed in air. This led to significant changes of the chemical composition and morphology on the surface of the WTi thin film. The results show an increase in surface roughness, due to formation of conical structures, about 50 nm wide in the base, and a very thin oxide layer composed of WO(3) and TiO(2), with a dominant TiO(2) phase at the top, within the depth of about 20 nm. The thickness of the oxide layer was dependent on the number of laser pulses. The samples were analyzed by scanning electron microscopy, atomic force microscopy, and X-ray photoelectron spectroscopy.
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Applied Physics. A: Materials Science and Processing, 2010, 98, 4, 843-847Funding / projects:
- Ministry of Science and Technological Development of the Republic of Serbia [142065], Ministry of Science and Technology of the Republic of Slovenia
DOI: 10.1007/s00339-010-5549-8
ISSN: 0947-8396
WoS: 000274330700020
Scopus: 2-s2.0-77649275638
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VinčaTY - JOUR AU - Petrović, Suzana AU - Gaković, Biljana M. AU - Peruško, Davor AU - Radak, Bojan AU - Desai, T. AU - Kovač, Janez AU - Panjan, Peter AU - Trtica, Milan PY - 2010 UR - https://vinar.vin.bg.ac.rs/handle/123456789/3891 AB - Picosecond (40 ps) pulsed Nd:YAG laser irradiation of a WTi thin film on silicon with a wavelength of 532 nm and a fluence 2.1 J/cm(2) was performed in air. This led to significant changes of the chemical composition and morphology on the surface of the WTi thin film. The results show an increase in surface roughness, due to formation of conical structures, about 50 nm wide in the base, and a very thin oxide layer composed of WO(3) and TiO(2), with a dominant TiO(2) phase at the top, within the depth of about 20 nm. The thickness of the oxide layer was dependent on the number of laser pulses. The samples were analyzed by scanning electron microscopy, atomic force microscopy, and X-ray photoelectron spectroscopy. T2 - Applied Physics. A: Materials Science and Processing T1 - Composition and structure modification of a WTi/Si system by short laser pulses VL - 98 IS - 4 SP - 843 EP - 847 DO - 10.1007/s00339-010-5549-8 ER -
@article{ author = "Petrović, Suzana and Gaković, Biljana M. and Peruško, Davor and Radak, Bojan and Desai, T. and Kovač, Janez and Panjan, Peter and Trtica, Milan", year = "2010", abstract = "Picosecond (40 ps) pulsed Nd:YAG laser irradiation of a WTi thin film on silicon with a wavelength of 532 nm and a fluence 2.1 J/cm(2) was performed in air. This led to significant changes of the chemical composition and morphology on the surface of the WTi thin film. The results show an increase in surface roughness, due to formation of conical structures, about 50 nm wide in the base, and a very thin oxide layer composed of WO(3) and TiO(2), with a dominant TiO(2) phase at the top, within the depth of about 20 nm. The thickness of the oxide layer was dependent on the number of laser pulses. The samples were analyzed by scanning electron microscopy, atomic force microscopy, and X-ray photoelectron spectroscopy.", journal = "Applied Physics. A: Materials Science and Processing", title = "Composition and structure modification of a WTi/Si system by short laser pulses", volume = "98", number = "4", pages = "843-847", doi = "10.1007/s00339-010-5549-8" }
Petrović, S., Gaković, B. M., Peruško, D., Radak, B., Desai, T., Kovač, J., Panjan, P.,& Trtica, M.. (2010). Composition and structure modification of a WTi/Si system by short laser pulses. in Applied Physics. A: Materials Science and Processing, 98(4), 843-847. https://doi.org/10.1007/s00339-010-5549-8
Petrović S, Gaković BM, Peruško D, Radak B, Desai T, Kovač J, Panjan P, Trtica M. Composition and structure modification of a WTi/Si system by short laser pulses. in Applied Physics. A: Materials Science and Processing. 2010;98(4):843-847. doi:10.1007/s00339-010-5549-8 .
Petrović, Suzana, Gaković, Biljana M., Peruško, Davor, Radak, Bojan, Desai, T., Kovač, Janez, Panjan, Peter, Trtica, Milan, "Composition and structure modification of a WTi/Si system by short laser pulses" in Applied Physics. A: Materials Science and Processing, 98, no. 4 (2010):843-847, https://doi.org/10.1007/s00339-010-5549-8 . .