Radioactive reliability of programmable memories
Abstract
In this study, we examine the reliability of erasable programmable read only memory (EPROM) and electrically erasable programmable read only memory (EEPROM) components under the influence of gamma radiation. This problem has significance in military industry and space technology Total dose results are presented for the JL 27C512D EPROM and 28C64C EEPROM components. There is evidence that EPROM components have better radioactive reliability than EEPROM components. Also, the changes to the EPROM are reversible, and after erasing and reprogramming all EPROM components are functional. On the other hand, changes to the EEPROM are irreversible, and under the influence of gamma radiation, all EEPROM components became permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers.
Keywords:
EPROM / EEPROM / radioactive reliability / gamma radiation / defectsSource:
Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers, 2001, 40, 2B, 1126-1129
DOI: 10.1143/JJAP.40.1126
ISSN: 0021-4922
WoS: 000168355800054
Scopus: 2-s2.0-0035245630
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Institution/Community
VinčaTY - JOUR AU - Lončar, Boris B. AU - Osmokrović, Predrag V. AU - Stojanović, M. AU - Stanković, Srboljub PY - 2001 UR - https://vinar.vin.bg.ac.rs/handle/123456789/2427 AB - In this study, we examine the reliability of erasable programmable read only memory (EPROM) and electrically erasable programmable read only memory (EEPROM) components under the influence of gamma radiation. This problem has significance in military industry and space technology Total dose results are presented for the JL 27C512D EPROM and 28C64C EEPROM components. There is evidence that EPROM components have better radioactive reliability than EEPROM components. Also, the changes to the EPROM are reversible, and after erasing and reprogramming all EPROM components are functional. On the other hand, changes to the EEPROM are irreversible, and under the influence of gamma radiation, all EEPROM components became permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers. T2 - Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers T1 - Radioactive reliability of programmable memories VL - 40 IS - 2B SP - 1126 EP - 1129 DO - 10.1143/JJAP.40.1126 ER -
@article{ author = "Lončar, Boris B. and Osmokrović, Predrag V. and Stojanović, M. and Stanković, Srboljub", year = "2001", abstract = "In this study, we examine the reliability of erasable programmable read only memory (EPROM) and electrically erasable programmable read only memory (EEPROM) components under the influence of gamma radiation. This problem has significance in military industry and space technology Total dose results are presented for the JL 27C512D EPROM and 28C64C EEPROM components. There is evidence that EPROM components have better radioactive reliability than EEPROM components. Also, the changes to the EPROM are reversible, and after erasing and reprogramming all EPROM components are functional. On the other hand, changes to the EEPROM are irreversible, and under the influence of gamma radiation, all EEPROM components became permanently nonfunctional. The obtained results are analyzed and explained via the interaction of gamma radiation with oxide layers.", journal = "Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers", title = "Radioactive reliability of programmable memories", volume = "40", number = "2B", pages = "1126-1129", doi = "10.1143/JJAP.40.1126" }
Lončar, B. B., Osmokrović, P. V., Stojanović, M.,& Stanković, S.. (2001). Radioactive reliability of programmable memories. in Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers, 40(2B), 1126-1129. https://doi.org/10.1143/JJAP.40.1126
Lončar BB, Osmokrović PV, Stojanović M, Stanković S. Radioactive reliability of programmable memories. in Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers. 2001;40(2B):1126-1129. doi:10.1143/JJAP.40.1126 .
Lončar, Boris B., Osmokrović, Predrag V., Stojanović, M., Stanković, Srboljub, "Radioactive reliability of programmable memories" in Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes and Review Papers, 40, no. 2B (2001):1126-1129, https://doi.org/10.1143/JJAP.40.1126 . .