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dc.creatorValidžić, Ivana Lj.
dc.creatorPopović, Maja
dc.creatorLojpur, Vesna
dc.creatorBundaleski, Nenad
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2018-06-12T11:16:02Z
dc.date.available2018-06-12T11:16:02Z
dc.date.issued2018
dc.identifier.issn0361-5235 (print)
dc.identifier.issn1543-186X (electronic)
dc.identifier.urihttp://link.springer.com/10.1007/s11664-018-6072-5
dc.identifier.urihttp://vinar.vin.bg.ac.rs/handle/123456789/7646
dc.description.abstractThe effect of incorporating copper (Cu) and selenium (Se) ions into stibnite (Sb2S3) lattice was investigated using x-ray photoelectron spectroscopy (XPS). The incorporation of Cu and Se ions was verified by comparing the XPS spectra of the undoped (amorphous Sb2S3), doped (p and n-doped) and pure Se and Cu-acetate powders. The main photoelectron Cu 2p(1/2) (951.8 eV) and Cu 2p(3/2) (932.1 eV) lines derived from the Cu-doped and Cu-acetate powder samples were clearly observed, whereas in the undoped sample, none of the characteristic lines of Cu were detected. The Se Auger line (138.6 eV), the only line of Se which does not coincide with the lines of Sb and S, was successfully detected in an Se-doped XPS sample and the spectrum of pure Se, while Se in the undoped sample was not found. Further, the XPS measurements revealed the relative amounts of Cu and Se in antimony sulfide, as well as the oxidation state of copper incorporated into the matrix.
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS//
dc.rightsrestrictedAccess
dc.sourceJournal of Electronic Materials
dc.subjectSb2S3en
dc.subjectsemiconductoren
dc.subjectX-ray photoelectron spectrosen
dc.subjectsolar energy material
dc.titleConfirmation of Incorporation of Cu and Se Ions in Applied p- and n-Type-Doped Sb2S3 by Photoemission Spectroscopyen
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractЛојпур, Весна; Валиджић, Ивана Љ.; Бундалески, Ненад; Ракочевић, Златко Љ.; Поповић, Маја;
dc.rights.holder© Copyright 2018 Elsevier B.V.
dc.citation.volume47
dc.citation.issue4
dc.citation.spage2402
dc.citation.epage2410
dc.identifier.wos000426586000028
dc.identifier.doi10.1007/s11664-018-6072-5
dc.identifier.scopus2-s2.0-85040988704


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