Characterization of New Structure for Silicon Carbide X-Ray Detector by Method Monte Carlo
АуториStanković, Srboljub J.
Ilic, R. D.
Janković, Ksenija S.
Lončar, Boris B.
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This work presents a characterization of radiation absorption properties of silicon carbide (SiC) as semiconductor for the realization of detectors for X-rays. SiC detectors can potentially reach superior performance with respect to all the other semiconductors presently employed in hazardous environments in nuclear and space science and technology. Physics and numerical modeling of photons transport through SiC detector is incorporated in non-destructive Monte Carlo method for determining the energy deposited and dose distribution. The Monte Carlo code has been adopted for numerical simulations for different detector conditions and configurations. The X-ray characterization of new SiC structures originates the improving of design of these detector systems.
Извор:Acta Physica Polonica. Series A: General Physics, Physics of Condensed Matter, Optics and Quantum Electronics, Atomic and Molecular Physics, Applied Physics, 2011, 120, 2, 252-255
- 12th Annual YUCOMAT Conference, Sep 06-10, 2010, Herceg Novi, Montenegro