SEM and XRD characterization of Ni-Hf alloys at low Hf concentration
Само за регистроване кориснике
2006
Аутори
Umićević, AnaMahnke, Heinz-Eberhard
Cekić, Božidar Đ.
Grbović, Jasmina
Koteski, Vasil J.
Belošević-Čavor, Jelena
Чланак у часопису (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
The alloying and phase formation in Ni-Hf samples with 0.2-, 2-, and 5-at.% Hf were studied by X-ray diffraction (XRD) technique and scanning electron microscopy (SEM). Both characterization methods, XRD and SEM, reveal the presence of the HfNi5 phase (fee structure) where the excess Ni atoms are present in the form of Ni or Ni-rich segregations in the sample containing 5-at.% Hf. The sample with 2-at.% Hf is characterized by the presence of the two phases present in the 5-at.% sample and by Hf atoms, which occupy substitutional lattice positions in the Ni lattice. Finally, in the third sample with 0.2-at.% Hf, the Hf atoms mainly substitute the Ni atoms in the lattice. This analysis is being complemented with additional information on the local structure around Hf by extended X-ray absorption fine structure spectroscopy (EXAFS).
Кључне речи:
EXAFS / HfNi5 / microstructural analysis / Ni-Hf alloysИзвор:
Materials Science Forum, 2006, 518, 325-330Финансирање / пројекти:
- Пероксидни антималарици и њихове химере са хинолинима: синтеза и биолошка активност (RS-MESTD-MPN2006-2010-142022)
- Синтеза и особине наноструктурних металних, интерметалних и композитних материјала (RS-MESTD-MPN2006-2010-142027)
Напомена:
- YUCOMAT 2005 : 7th Conference of the Yugoslav-Materials-Research-Society (Yu-MRS) : Recent Developments in Advanced Materials and Processes, Sep 12-16, 2005, Herceg Novi, Montenegro
DOI: 10.4028/www.scientific.net/msf.518.325
ISSN: 0255-5476
WoS: 000239351800054
Scopus: 2-s2.0-37849020667
Колекције
Институција/група
VinčaTY - JOUR AU - Umićević, Ana AU - Mahnke, Heinz-Eberhard AU - Cekić, Božidar Đ. AU - Grbović, Jasmina AU - Koteski, Vasil J. AU - Belošević-Čavor, Jelena PY - 2006 UR - https://vinar.vin.bg.ac.rs/handle/123456789/6610 AB - The alloying and phase formation in Ni-Hf samples with 0.2-, 2-, and 5-at.% Hf were studied by X-ray diffraction (XRD) technique and scanning electron microscopy (SEM). Both characterization methods, XRD and SEM, reveal the presence of the HfNi5 phase (fee structure) where the excess Ni atoms are present in the form of Ni or Ni-rich segregations in the sample containing 5-at.% Hf. The sample with 2-at.% Hf is characterized by the presence of the two phases present in the 5-at.% sample and by Hf atoms, which occupy substitutional lattice positions in the Ni lattice. Finally, in the third sample with 0.2-at.% Hf, the Hf atoms mainly substitute the Ni atoms in the lattice. This analysis is being complemented with additional information on the local structure around Hf by extended X-ray absorption fine structure spectroscopy (EXAFS). T2 - Materials Science Forum T1 - SEM and XRD characterization of Ni-Hf alloys at low Hf concentration VL - 518 SP - 325 EP - 330 DO - 10.4028/www.scientific.net/msf.518.325 UR - https://hdl.handle.net/21.15107/rcub_vinar_6610 ER -
@article{ author = "Umićević, Ana and Mahnke, Heinz-Eberhard and Cekić, Božidar Đ. and Grbović, Jasmina and Koteski, Vasil J. and Belošević-Čavor, Jelena", year = "2006", abstract = "The alloying and phase formation in Ni-Hf samples with 0.2-, 2-, and 5-at.% Hf were studied by X-ray diffraction (XRD) technique and scanning electron microscopy (SEM). Both characterization methods, XRD and SEM, reveal the presence of the HfNi5 phase (fee structure) where the excess Ni atoms are present in the form of Ni or Ni-rich segregations in the sample containing 5-at.% Hf. The sample with 2-at.% Hf is characterized by the presence of the two phases present in the 5-at.% sample and by Hf atoms, which occupy substitutional lattice positions in the Ni lattice. Finally, in the third sample with 0.2-at.% Hf, the Hf atoms mainly substitute the Ni atoms in the lattice. This analysis is being complemented with additional information on the local structure around Hf by extended X-ray absorption fine structure spectroscopy (EXAFS).", journal = "Materials Science Forum", title = "SEM and XRD characterization of Ni-Hf alloys at low Hf concentration", volume = "518", pages = "325-330", doi = "10.4028/www.scientific.net/msf.518.325", url = "https://hdl.handle.net/21.15107/rcub_vinar_6610" }
Umićević, A., Mahnke, H., Cekić, B. Đ., Grbović, J., Koteski, V. J.,& Belošević-Čavor, J.. (2006). SEM and XRD characterization of Ni-Hf alloys at low Hf concentration. in Materials Science Forum, 518, 325-330. https://doi.org/10.4028/www.scientific.net/msf.518.325 https://hdl.handle.net/21.15107/rcub_vinar_6610
Umićević A, Mahnke H, Cekić BĐ, Grbović J, Koteski VJ, Belošević-Čavor J. SEM and XRD characterization of Ni-Hf alloys at low Hf concentration. in Materials Science Forum. 2006;518:325-330. doi:10.4028/www.scientific.net/msf.518.325 https://hdl.handle.net/21.15107/rcub_vinar_6610 .
Umićević, Ana, Mahnke, Heinz-Eberhard, Cekić, Božidar Đ., Grbović, Jasmina, Koteski, Vasil J., Belošević-Čavor, Jelena, "SEM and XRD characterization of Ni-Hf alloys at low Hf concentration" in Materials Science Forum, 518 (2006):325-330, https://doi.org/10.4028/www.scientific.net/msf.518.325 ., https://hdl.handle.net/21.15107/rcub_vinar_6610 .