Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation
Apstrakt
This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430 nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Da and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered... by traditional surface statistical parameters. (C) 2013 Elsevier B.V. All rights reserved.
Ključne reči:
Atomic force microscopy / SWCNTs / OPO laser / Multifractal analysis / Surface roughnessIzvor:
Applied Surface Science, 2014, 289, 97-106Finansiranje / projekti:
- Tanki slojevi jednoslojnih ugljeničnih nanotuba i grafena za primenu u elektronici (RS-MESTD-Basic Research (BR or ON)-172003)
DOI: 10.1016/j.apsusc.2013.10.114
ISSN: 0169-4332; 1873-5584
WoS: 000328635700015
Scopus: 2-s2.0-84890558770
Kolekcije
Institucija/grupa
VinčaTY - JOUR AU - Talu, Stefan AU - Marković, Zoran M. AU - Stach, Sebastian AU - Todorović-Marković, Biljana AU - Talu, Mihai PY - 2014 UR - https://vinar.vin.bg.ac.rs/handle/123456789/5811 AB - This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430 nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Da and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters. (C) 2013 Elsevier B.V. All rights reserved. T2 - Applied Surface Science T1 - Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation VL - 289 SP - 97 EP - 106 DO - 10.1016/j.apsusc.2013.10.114 ER -
@article{ author = "Talu, Stefan and Marković, Zoran M. and Stach, Sebastian and Todorović-Marković, Biljana and Talu, Mihai", year = "2014", abstract = "This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure to optical parametric oscillator laser irradiation at wavelength of 430 nm. Microstructure and morphological changes of carbon nanotube films deposited on different substrates (mica and TGX grating) were recorded by atomic force microscope. A detailed methodology for surface multifractal characterization, which may be applied for atomic force microscopy data, was presented. Multifractal analysis of surface roughness revealed that carbon nanotube films surface has a multifractal geometry at various magnifications. The generalized dimension Da and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of carbon nanotube films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters. (C) 2013 Elsevier B.V. All rights reserved.", journal = "Applied Surface Science", title = "Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation", volume = "289", pages = "97-106", doi = "10.1016/j.apsusc.2013.10.114" }
Talu, S., Marković, Z. M., Stach, S., Todorović-Marković, B.,& Talu, M.. (2014). Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation. in Applied Surface Science, 289, 97-106. https://doi.org/10.1016/j.apsusc.2013.10.114
Talu S, Marković ZM, Stach S, Todorović-Marković B, Talu M. Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation. in Applied Surface Science. 2014;289:97-106. doi:10.1016/j.apsusc.2013.10.114 .
Talu, Stefan, Marković, Zoran M., Stach, Sebastian, Todorović-Marković, Biljana, Talu, Mihai, "Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation" in Applied Surface Science, 289 (2014):97-106, https://doi.org/10.1016/j.apsusc.2013.10.114 . .