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dc.creatorMarkushev, Dragan D.
dc.creatorRabasović, Mihailo D.
dc.creatorTodorovic, D. M.
dc.creatorGalović, Slobodanka
dc.creatorBialkowski, S. E.
dc.date.accessioned2018-03-01T16:02:59Z
dc.date.available2018-03-01T16:02:59Z
dc.date.issued2015
dc.identifier.issn0034-6748 (print)
dc.identifier.issn1089-7623 (electronic)
dc.identifier.urihttp://vinar.vin.bg.ac.rs/123456789/488
dc.description.abstractMethods for photoacoustic signal measurement, rectification, and analysis for 85 mu m thin Si samples in the 20-20 000 Hz modulation frequency range are presented. Methods for frequency-dependent amplitude and phase signal rectification in the presence of coherent and incoherent noise as well as distortion due to microphone characteristics are presented. Signal correction is accomplished using inverse system response functions deduced by comparing real to ideal signals for a sample with well-known bulk parameters and dimensions. The system response is a piece-wise construction, each component being due to a particular effect of the measurement system. Heat transfer and elastic effects are modeled using standard Rosencweig-Gersho and elastic-bending theories. Thermal diffusion, thermoelastic, and plasmaelastic signal components are calculated and compared to measurements. The differences between theory and experiment are used to detect and correct signal distortion and to determine detector and sound-card characteristics. Corrected signal analysis is found to faithfully reflect known sample parameters. (C) 2015 AIP Publishing LLC.en
dc.relationinfo:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/171016/RS//
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS//
dc.rightsclosedAccessen
dc.sourceReview of Scientific Instrumentsen
dc.titlePhotoacoustic signal and noise analysis for Si thin plate: Signal correction in frequency domainen
dc.typearticleen
dcterms.abstractГаловић Слободанка; Маркусхев, Д. Д.; Рабасовиц, М. Д.; Тодоровиц, Д. М.; Биалкоwски, С. Е.;
dc.citation.volume86
dc.citation.issue3
dc.identifier.wos000352201400075
dc.identifier.doi10.1063/1.4914894
dc.citation.otherArticle Number: 035110
dc.citation.rankM22
dc.identifier.pmid25832278
dc.identifier.scopus2-s2.0-84925799276


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