XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor
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Radisavljević, IvanaTrigueiro, J.
Bundaleski, Nenad
Medić, Mirjana
Romčević, Nebojša Ž.
Teodoro, Orlando M. N. D.
Mitrić, Miodrag
Ivanović, Nenad
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Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved.
Keywords:
Semiconductors / Impurities in semiconductors / Photoelectron spectroscopiesSource:
Journal of Alloys and Compounds, 2015, 632, 17-22Funding / projects:
- Optoelectronics nanodimension systems - the rout towards applications (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45003)
- ELISA - European Light Sources Activities - Synchrotrons and Free Electron Lasers (EU-FP7-226716)
- Republic of Serbia [451-03-02328/2012-14/03], Republic of Portugal [451-03-02328/2012-14/03], Portuguese Research Grant through FCT-MEC [Pest-OE/FIS/UI0068/2011]
DOI: 10.1016/j.jallcom.2015.01.169
ISSN: 0925-8388; 1873-4669
WoS: 000350388900003
Scopus: 2-s2.0-84922375565
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VinčaTY - JOUR AU - Radisavljević, Ivana AU - Trigueiro, J. AU - Bundaleski, Nenad AU - Medić, Mirjana AU - Romčević, Nebojša Ž. AU - Teodoro, Orlando M. N. D. AU - Mitrić, Miodrag AU - Ivanović, Nenad PY - 2015 UR - https://vinar.vin.bg.ac.rs/handle/123456789/425 AB - Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved. T2 - Journal of Alloys and Compounds T1 - XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor VL - 632 SP - 17 EP - 22 DO - 10.1016/j.jallcom.2015.01.169 ER -
@article{ author = "Radisavljević, Ivana and Trigueiro, J. and Bundaleski, Nenad and Medić, Mirjana and Romčević, Nebojša Ž. and Teodoro, Orlando M. N. D. and Mitrić, Miodrag and Ivanović, Nenad", year = "2015", abstract = "Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed. (C) 2015 Elsevier B.V. All rights reserved.", journal = "Journal of Alloys and Compounds", title = "XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor", volume = "632", pages = "17-22", doi = "10.1016/j.jallcom.2015.01.169" }
Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N. Ž., Teodoro, O. M. N. D., Mitrić, M.,& Ivanović, N.. (2015). XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. in Journal of Alloys and Compounds, 632, 17-22. https://doi.org/10.1016/j.jallcom.2015.01.169
Radisavljević I, Trigueiro J, Bundaleski N, Medić M, Romčević NŽ, Teodoro OMND, Mitrić M, Ivanović N. XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. in Journal of Alloys and Compounds. 2015;632:17-22. doi:10.1016/j.jallcom.2015.01.169 .
Radisavljević, Ivana, Trigueiro, J., Bundaleski, Nenad, Medić, Mirjana, Romčević, Nebojša Ž., Teodoro, Orlando M. N. D., Mitrić, Miodrag, Ivanović, Nenad, "XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor" in Journal of Alloys and Compounds, 632 (2015):17-22, https://doi.org/10.1016/j.jallcom.2015.01.169 . .