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dc.creatorMilosavljević, Momir
dc.creatorWong, Lewis
dc.creatorLourenco, Manon
dc.creatorValizadeh, Reza
dc.creatorColligon, John
dc.creatorShao, Guosheng
dc.creatorHomewood, Kevin P.
dc.date.accessioned2018-03-01T21:21:48Z
dc.date.available2018-03-01T21:21:48Z
dc.date.issued2010
dc.identifier.issn0021-4922
dc.identifier.urihttps://vinar.vin.bg.ac.rs/handle/123456789/4097
dc.description.abstractIron-disilicide films were sputter deposited on Si(100) wafers to 300-400 nm, at substrate temperatures ranging from room temperature to 700 degrees C As-deposited films were amorphous at deposition temperatures up to 200 degrees C, and crystalline beta-FeSi2 at 300-700 degrees C Amorphous films were heat-treated after deposition at 300-700 degrees C They remained amorphous up to 400 degrees C, and transformed to crystalline beta-FeSi2 at 500-700 degrees C Optical absorption measurements showed that the band gap of all films is direct in nature, ranging from 0 88 to 0 93 eV The deposition temperature was seen to affect the crystallinity of the as-deposited films and to vary their optical properties significantly The photoabsorption coefficient, measured at 1 eV, increased from 5 6 x 10(4) cm(-1) for amorphous films to 1.2 x 10(5) cm(-1) for the samples deposited at 700 degrees C The films crystallized by heat-treatment had a markedly different and irregular structure, resulting in their lower optical absorption (C) 2010 The Japan Society of Applied Physicsen
dc.relationEPSRS UK, Serbian Ministry of Science and Technological Development [141013]
dc.rightsrestrictedAccessen
dc.sourceJapanese Journal of Applied Physicsen
dc.titleCorrelation of Structural and Optical Properties of Sputtered FeSi2 Thin Filmsen
dc.typearticleen
dcterms.abstractМилосављевић Момир; Схао, Гуосхенг; Лоуренцо, Манон; Вализадех, Реза; Цоллигон, Јохн; Хомеwоод, Кевин; Wонг, Леwис;
dc.citation.volume49
dc.citation.issue8
dc.identifier.wos000281513400029
dc.identifier.doi10.1143/JJAP.49.081401
dc.citation.otherPart number: 1, Article Number: 081401
dc.citation.rankM23
dc.identifier.scopus2-s2.0-77957870897


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