The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps
Abstract
This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission.
Source:
Plasma Sources Science and Technology, 2007, 16, 2, 337-340
DOI: 10.1088/0963-0252/16/2/017
ISSN: 0963-0252
WoS: 000246556000017
Scopus: 2-s2.0-34247493291
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Institution/Community
VinčaTY - JOUR AU - Radmilovic-Radjenovic, Marija AU - Rađenović, Branislav PY - 2007 UR - https://vinar.vin.bg.ac.rs/handle/123456789/3196 AB - This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission. T2 - Plasma Sources Science and Technology T1 - The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps VL - 16 IS - 2 SP - 337 EP - 340 DO - 10.1088/0963-0252/16/2/017 ER -
@article{ author = "Radmilovic-Radjenovic, Marija and Rađenović, Branislav", year = "2007", abstract = "This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission.", journal = "Plasma Sources Science and Technology", title = "The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps", volume = "16", number = "2", pages = "337-340", doi = "10.1088/0963-0252/16/2/017" }
Radmilovic-Radjenovic, M.,& Rađenović, B.. (2007). The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps. in Plasma Sources Science and Technology, 16(2), 337-340. https://doi.org/10.1088/0963-0252/16/2/017
Radmilovic-Radjenovic M, Rađenović B. The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps. in Plasma Sources Science and Technology. 2007;16(2):337-340. doi:10.1088/0963-0252/16/2/017 .
Radmilovic-Radjenovic, Marija, Rađenović, Branislav, "The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps" in Plasma Sources Science and Technology, 16, no. 2 (2007):337-340, https://doi.org/10.1088/0963-0252/16/2/017 . .