The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps
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This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission.
Извор:Plasma Sources Science and Technology, 2007, 16, 2, 337-340
ISSN: 0963-0252 (print)