Dielectric relaxation study of gamma irradiated oriented low-density polyethylene
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The influence of drawing, gamma irradiation and accelerated aging on the dielectric relaxation of low-density polyethylene has been studied using dielectric loss tangent measurements in the temperature range from 25 to 325 K and in the frequency range from 10(3) to 10(6) Hz. The intensity, position and activation energy of the gamma- and beta-dielectric relaxations were found to be strongly dependent upon the changes in the microstructure of the amorphous phase induced by uniaxial orientation, oxidation and crosslinking. (C) 2003 Elsevier Science Ltd. All rights reserved.