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dc.creatorCekić, Božidar Đ.
dc.creatorIvanović, Nenad
dc.creatorRakočević, Zlatko Lj.
dc.creatorKoteski, Vasil J.
dc.creatorManasijević, Miodrag
dc.creatorKoiki, S
dc.date.accessioned2018-03-01T18:38:07Z
dc.date.available2018-03-01T18:38:07Z
dc.date.issued1998
dc.identifier.issn0021-8979 (print)
dc.identifier.urihttp://vinar.vin.bg.ac.rs/handle/123456789/2199
dc.description.abstractThe grain structure and interatomic distances in annealed Hf2Fe, as well as in nonannealed and annealed Hf2Co polycrystalline isostructural phases, with unit cells of the Ti2Ni type, ale studied using scanning tunneling microscopy (STM) in air. In contrast to x-ray powder diffraction data, refined according to the Rietveld profile method, STM measurements show discrepancies between compounds, caused by the peculiarities of their electronic structure. The results obtained give better insight into the extensive electric field gradient measurements performed in this class of compounds, which could not be properly explained by the existing crystallographic data alone. (C) 1998 American Institute of Physics. [S0021-8979(98)05421-8].en
dc.rightsrestrictedAccessen
dc.sourceJournal of Applied Physicsen
dc.titleStructure and bond length distribution in Hf2Fe and Hf2Co intermetallic compoundsen
dc.typearticleen
dcterms.abstractЦекиц, Б; Манасијевиц, М; Коики, С; Ивановић Ненад; Ракочевић Златко Љ.; Котески Васил Ј.;
dc.citation.volume84
dc.citation.issue9
dc.citation.spage4842
dc.citation.epage4846
dc.identifier.wos000076428500028
dc.identifier.doi10.1063/1.368726
dc.citation.rankM21
dc.identifier.scopus2-s2.0-0012453168


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