Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique
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Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.
Кључне речи:Glancing Angle Deposition / XPS / AFM / Nickel thin film
Извор:Science of Sintering, 2016, 48, 1, 51-56
ISSN: 0350-820X (print)