Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film
Samo za registrovane korisnike
2016
Autori
Gilić, Martina D.Petrović, Milica S.
Kostić, Radmila
Stojanović, Dušanka
Barudžija, Tanja
Mitrić, Miodrag
Romčević, Nebojša Ž.
Ralević, Uroš
Trajić, Jelena
Romčević, Maja J.
Yahia, Ibrahim S.
Članak u časopisu (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
This paper describes the structural and optical properties of Cu-Se thin films. The surface morphology of thin films was investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Formation of Cu-Se thin films is concluded to proceed unevenly, in the form of islands which later grew into agglomerates. The structural characterization of Cu-Se thin film was investigated using X-ray diffraction pattern (XRD). The presence of two-phase system is observed. One is the solid solution of Cu in Se and the other is low-pressure modification of CuSe2. The Raman spectroscopy was used to identify and quantify the individual phases present in the Cu-Se films. Red shift and asymmetry of Raman mode characteristic for CuSe2 enable us to estimate nanocrystal dimension. In the analysis of the far infrared reflection spectra, numerical model for calculating the reflectivity coefficient of layered system, which includes film with nanocrystalite inclusions (modeled by Maxwell -Gar...nett approximation) and substrate, has been applied. (C) 2016 Elsevier B.V. All rights reserved.
Ključne reči:
Thin films / Optical properties / Spectroscopy / Maxwell-Garnett mixing modelIzvor:
Infrared Physics and Technology, 2016, 76, 276-284Finansiranje / projekti:
- Optoelektronski nanodimenzioni sistemi - put ka primeni (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45003)
DOI: 10.1016/j.infrared.2016.03.008
ISSN: 1350-4495; 1879-0275
WoS: 000377725100034
Scopus: 2-s2.0-84961859313
Kolekcije
Institucija/grupa
VinčaTY - JOUR AU - Gilić, Martina D. AU - Petrović, Milica S. AU - Kostić, Radmila AU - Stojanović, Dušanka AU - Barudžija, Tanja AU - Mitrić, Miodrag AU - Romčević, Nebojša Ž. AU - Ralević, Uroš AU - Trajić, Jelena AU - Romčević, Maja J. AU - Yahia, Ibrahim S. PY - 2016 UR - https://vinar.vin.bg.ac.rs/handle/123456789/1116 AB - This paper describes the structural and optical properties of Cu-Se thin films. The surface morphology of thin films was investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Formation of Cu-Se thin films is concluded to proceed unevenly, in the form of islands which later grew into agglomerates. The structural characterization of Cu-Se thin film was investigated using X-ray diffraction pattern (XRD). The presence of two-phase system is observed. One is the solid solution of Cu in Se and the other is low-pressure modification of CuSe2. The Raman spectroscopy was used to identify and quantify the individual phases present in the Cu-Se films. Red shift and asymmetry of Raman mode characteristic for CuSe2 enable us to estimate nanocrystal dimension. In the analysis of the far infrared reflection spectra, numerical model for calculating the reflectivity coefficient of layered system, which includes film with nanocrystalite inclusions (modeled by Maxwell -Garnett approximation) and substrate, has been applied. (C) 2016 Elsevier B.V. All rights reserved. T2 - Infrared Physics and Technology T1 - Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film VL - 76 SP - 276 EP - 284 DO - 10.1016/j.infrared.2016.03.008 ER -
@article{ author = "Gilić, Martina D. and Petrović, Milica S. and Kostić, Radmila and Stojanović, Dušanka and Barudžija, Tanja and Mitrić, Miodrag and Romčević, Nebojša Ž. and Ralević, Uroš and Trajić, Jelena and Romčević, Maja J. and Yahia, Ibrahim S.", year = "2016", abstract = "This paper describes the structural and optical properties of Cu-Se thin films. The surface morphology of thin films was investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Formation of Cu-Se thin films is concluded to proceed unevenly, in the form of islands which later grew into agglomerates. The structural characterization of Cu-Se thin film was investigated using X-ray diffraction pattern (XRD). The presence of two-phase system is observed. One is the solid solution of Cu in Se and the other is low-pressure modification of CuSe2. The Raman spectroscopy was used to identify and quantify the individual phases present in the Cu-Se films. Red shift and asymmetry of Raman mode characteristic for CuSe2 enable us to estimate nanocrystal dimension. In the analysis of the far infrared reflection spectra, numerical model for calculating the reflectivity coefficient of layered system, which includes film with nanocrystalite inclusions (modeled by Maxwell -Garnett approximation) and substrate, has been applied. (C) 2016 Elsevier B.V. All rights reserved.", journal = "Infrared Physics and Technology", title = "Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film", volume = "76", pages = "276-284", doi = "10.1016/j.infrared.2016.03.008" }
Gilić, M. D., Petrović, M. S., Kostić, R., Stojanović, D., Barudžija, T., Mitrić, M., Romčević, N. Ž., Ralević, U., Trajić, J., Romčević, M. J.,& Yahia, I. S.. (2016). Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film. in Infrared Physics and Technology, 76, 276-284. https://doi.org/10.1016/j.infrared.2016.03.008
Gilić MD, Petrović MS, Kostić R, Stojanović D, Barudžija T, Mitrić M, Romčević NŽ, Ralević U, Trajić J, Romčević MJ, Yahia IS. Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film. in Infrared Physics and Technology. 2016;76:276-284. doi:10.1016/j.infrared.2016.03.008 .
Gilić, Martina D., Petrović, Milica S., Kostić, Radmila, Stojanović, Dušanka, Barudžija, Tanja, Mitrić, Miodrag, Romčević, Nebojša Ž., Ralević, Uroš, Trajić, Jelena, Romčević, Maja J., Yahia, Ibrahim S., "Structural and optical properties of CuSe2 nanocrystals formed in thin solid Cu-Se film" in Infrared Physics and Technology, 76 (2016):276-284, https://doi.org/10.1016/j.infrared.2016.03.008 . .